Spectrometric Measurement Apparatus Using Diffraction Element
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Solution Overview
Problem
Conventional spectrometric measurement apparatuses face challenges in reading data at high speed while acquiring high-precision spectroscopic data across the full width of an image, often resulting in positional shifts and unreliable color variations due to misalignment of observation positions in different wavelength bands.
Innovation Solution
A spectrometric measurement apparatus utilizing a line radiation light source, a diffraction element with a sawtooth cross-sectional shape, and a line sensor with N pixels arranged in a one-dimensional direction, where light beams of different wavelengths are dispersed and directed into specific pixels, allowing for high-speed data acquisition without the need for precise alignment of observation positions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional spectrometric measurement apparatuses use area sensors or line sensors with plural photographing systems to measure spectral properties across the full width of an image, then measurement precision can be improved, but positional shifts occur between different wavelength bands due to the need for precise alignment of observation positions
Solution Approach 1:
The patent transforms the two-dimensional measurement problem (requiring alignment in both X and Y directions) into a one-dimensional problem by using a line sensor that captures the entire width of the image in the X direction simultaneously. The diffraction element disperses light in the Y direction, allowing spectral separation without requiring positional alignment between different wavelength bands. This dimensional transformation eliminates the alignment complexity while maintaining measurement precision.
Solution Approach 2:
The patent introduces a diffraction element as an intermediary component between the line sensor and the image. This diffraction element disperses reflected light from different wavelength bands onto different pixels of the line sensor, enabling spectral property measurement without requiring direct alignment of observation positions. The diffraction element acts as a mediator that separates wavelengths spatially, solving the alignment problem.
2Measurement precision
If conventional apparatuses use plural photographing systems with different wavelength bands to measure color information, then spectral data can be acquired, but reading speed is reduced due to the need for sequential measurement and alignment processing
Solution Approach 1:
The patent enables continuous spectral measurement across the full width of the image by using a line sensor that captures all spatial positions simultaneously in one shot. The diffraction element continuously disperses light from all wavelengths onto corresponding pixels, eliminating the need for sequential scanning or multiple measurements. This continuous action maintains spectral accuracy while dramatically improving reading speed.
Solution Approach 2:
The patent uses the vertical dimension (Y direction) for wavelength separation through the diffraction element, while the horizontal dimension (X direction) captures the full width of the image simultaneously. This allows all spectral information to be acquired in parallel across the image width, transforming a sequential process into a parallel one, thus improving productivity without sacrificing measurement precision.
3Area of stationary object
If conventional systems use two-dimensional pixel structures with CCDs to acquire spectral properties, then full width measurement is possible, but data reading speed is considerably slower compared to line sensors
Solution Approach 1:
The patent segments the spectral measurement function from the spatial measurement function. The line sensor maintains full spatial coverage across the image width, while the diffraction element segments different wavelengths onto different pixels of the same line sensor. This segmentation allows simultaneous capture of all spatial and spectral information in one shot, achieving both full area coverage and high reading speed.
Solution Approach 2:
The patent replaces the mechanical scanning system or sequential photographing system with an optical system using a diffraction element. Instead of mechanically moving components or sequentially capturing images, the diffraction element optically disperses light to achieve spectral separation. This substitution eliminates mechanical constraints and enables simultaneous capture of all data, dramatically improving reading speed while maintaining full area coverage.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables high-precision spectral property measurement across the full width of an image at a faster rate, reducing positional shifts and color variation errors, and allowing for precise spectral data acquisition regardless of image height.
Implementation Method 1
a diffraction element 17, which disperses light beams into light beams of respective wavelengths and directs light beams of predetermined wavelength bands into predetermined pixels
Implementation Method 2
the diffraction element 17, which disperses light beams into light beams of respective wavelengths
Data Source
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AI summary
A spectrometric measurement apparatus includes a light radiation unit for radiating light onto a medium; a hole array including openings arranged one-dimensionally for transmitting diffusion light from the medium; an imaging optical system configured to focus an image from the hole array; a diffraction element configured to diffract the light for focusing the image; and a light receiving unit including pixels arranged one-dimensionally configured to receive the light that has been dispersed by the diffraction element and spectrometric sensors each corresponding to a predetermined number of the pixels. The light transmitted through each of the openings of the hole array is dispersed by the diffraction element, and then the light enters the pixels so that spectral properties of the diffusion light are acquired. The structure of the diffraction element includes variations that are formed in accordance with the height of the image that is focused by the imaging optical system.