Spectrophotometer Baseline Averaging at Measurement Scan Speed
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Solution Overview
Problem
Spectrophotometers face challenges in achieving high-accuracy measurements due to variations in light source energy values across different wavelength ranges, leading to inaccuracies in baseline corrections, especially when the energy values are low, and slowing down the wavelength change speed to improve accuracy increases measurement time.
Innovation Solution
A spectrophotometer system that repeatedly measures and averages the baseline at the same wavelength changing speed as the actual sample measurement, correcting the spectral intensity distribution using the averaged baseline to account for energy fluctuations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the wavelength change speed is reduced to improve baseline measurement accuracy, then measurement precision is improved, but measurement time is increased
Solution Approach 1:
The patent performs baseline measurement before actual sample measurement, allowing the system to pre-characterize the light source energy distribution and optical path. This preliminary action enables the use of faster scanning speeds during actual measurements while maintaining accuracy through the pre-obtained baseline information.
Solution Approach 2:
The patent separates baseline measurement from sample measurement into distinct processes. By segmenting these functions, the system can optimize each independently - using slower scanning for accurate baseline characterization and faster scanning for efficient sample analysis, thereby resolving the time-accuracy tradeoff.
2Measurement precision
If baseline measurement is performed multiple times at the same wavelength changing speed, then measurement precision is improved through averaging, but device complexity is increased
Solution Approach 1:
The patent implements a feedback mechanism where baseline measurement results are used to correct sample measurement data. By repeatedly measuring the baseline and using the averaged results for correction, the system continuously refines measurement accuracy without requiring complex hardware modifications.
Solution Approach 2:
The patent changes the measurement parameter by performing multiple baseline measurements at the same scanning speed and then averaging the results. This parameter change approach (number of repetitions) improves precision without increasing the fundamental complexity of the measurement system or requiring slower scanning speeds.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach allows for accurate baseline averaging without reducing the wavelength change speed, maintaining measurement efficiency and accuracy by matching measurement conditions, thereby stabilizing the correction value and reducing measurement time.
Implementation Method 1
a spectrometer configured to separate light from the light source at a specified wavelength changing speed
Implementation Method 2
a detector configured to detect sample transmission luminous flux that is transmitted through a measurement sample
Implementation Method 3
corrects the spectral intensity distribution using the averaged baseline
Data Source
AI summary
A spectrophotometer includes a light source, a spectrometer separating light from the light source, a beam splitter separating a light path of the light separated by the spectrometer into sample-side luminous flux and reference-side luminous flux, a sample-side detector detecting the sample-side luminous flux that has passed through a measurement sample and a reference-side detector detecting the reference-side luminous flux that has passed through a reference-side sample, a controller obtaining spectral intensity distribution of the sample-side luminous flux from the measurement sample and spectral intensity distribution of reference-side luminous flux from the reference sample, wherein the controller repeatedly performs measurement of a baseline a plurality of times at a wavelength changing speed at the time of actual measurement for measuring the measurement sample, thereby performing an averaging process of averaging accumulated values of a plurality of measurement values of the baseline.