Spectrophotometer Light Receiver Filter Layer
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Solution Overview
Problem
Existing spectrophotometers face measurement accuracy issues due to high-order diffracted light interfering with incorrect light receiving elements and multiple reflections between the light receiver and a quartz glass window plate, which are not effectively addressed by adjusting the positional relationship between the spectroscopic element and the light receiver.
Innovation Solution
A spectrophotometer design where the light receiver has a filter layer directly in contact with its surface to shield high-order diffracted light, eliminating the need for a quartz glass window plate and reducing multiple reflections, with the filter layer having specific transmittance ranges to prevent high-order diffracted light from reaching incorrect elements.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a quartz glass window plate with a filter is disposed between the spectroscopic element and the light receiver, then high-order diffracted light is shielded, but multiple reflections occur between the window plate and light receiver causing light to reach incorrect light receiving elements
Solution Approach 1:
The filter is extracted from the quartz glass window plate and applied directly to the light receiver surface. This removes the window plate that causes multiple reflections, while retaining the high-order diffracted light shielding function through the filter layer on the light receiver.
Solution Approach 2:
The filter function and light receiver are merged into a single integrated structure. The filter layer is formed directly on the light receiver surface, combining the light shielding function with the light detection function in one component, eliminating the need for a separate window plate.
2Measurement precision
If the positional relationship between spectroscopic element and light receiver is adjusted to prevent high-order diffracted light interference, then measurement accuracy improves for specific wavelength ranges, but other wavelength ranges remain affected by multiple reflections
Solution Approach 1:
The filter is applied locally and directly on the light receiver surface where light detection occurs. This localized filtering approach provides precise control over which wavelengths reach which light receiving elements, improving performance across all wavelength ranges simultaneously rather than just specific ranges.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration enhances measurement accuracy by preventing high-order diffracted light interference and reducing multiple reflections, thereby improving the overall spectral measurement accuracy across various wavelength ranges.
Implementation Method 1
high-order diffracted light of a certain wavelength generated in a diffraction grating
Implementation Method 2
a filter layer that shields high-order diffracted light from the spectroscopic element
Implementation Method 3
disperses transmitted light or scattered light of the sample for each wavelength by a spectroscopic element such as a diffraction grating or a prism
Implementation Method 4
detects the dispersed light of each wavelength by a light receiver such as a photodiode array (PDA) or a charge coupling device (CCD), thereby measuring an intensity distribution (wavelength spectrum) for each wavelength
Data Source
AI summary
Provided are a light source (2) that emits light to be applied to a sample, a spectroscopic element (12) that disperses the light from the sample for each wavelength; and a light receiver (14) in which light receiving elements for detecting light of each wavelength dispersed by the spectroscopic element (12) are arranged, the light receiver (14) having a surface in direct with a filter layer (16) that shields high-order diffracted light from the spectroscopic element.