Spectroscopic Analysis Parameter Selection for Time-Limited Accuracy

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Solution Overview

Problem

Existing spectroscopic analysis methods require long measurement times or may miss important spectra when constrained by a limited measurement period, leading to inefficient or incomplete data acquisition.

Innovation Solution

A spectroscopic analysis system that includes an input unit for setting measurement period and accuracy limits, and a control unit to derive recommended measurement conditions, such as wavelength ranges, sampling intervals, and slit widths, to optimize data collection within constraints.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If measurement is performed across the entire wavelength region to obtain high-resolution measurement results, then measurement precision is improved, but measurement time increases

Engineering Contradiction:
Improvemeasurement resolutionVSAvoidmeasurement time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent applies partial action by selectively measuring only specific wavelength regions that contain important spectral information rather than measuring the entire wavelength range. The system identifies and focuses on wavelength regions where target substances exhibit characteristic absorption or emission, thereby obtaining sufficient measurement precision while significantly reducing measurement time.

Inventive Principle:
Principle #16Partial or excessive action

Solution Approach 2:

The patent dynamically adjusts measurement parameters including wavelength range, sampling intervals, and slit width based on the specific analysis requirements and sample characteristics. By changing these parameters adaptively, the system optimizes the balance between measurement resolution and measurement time for different analytical scenarios.

Inventive Principle:
Principle #35Parameter changes

2Loss of time

If measurement is restricted to a specific wavelength to reduce measurement time, then measurement time is reduced, but important spectral data may be missed

Engineering Contradiction:
Improvemeasurement timeVSAvoidspectral data completeness
Core Design Contradiction:
Loss of timeVSLoss of information

Solution Approach 1:

The patent employs adaptive parameter adjustment by modifying wavelength range and sampling interval based on preliminary analysis or known spectral characteristics of target substances. This allows the system to concentrate measurement resources on informative wavelength regions while maintaining measurement time efficiency and avoiding loss of critical spectral information.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The system performs preliminary spectral analysis or uses prior knowledge of target substance characteristics to identify important wavelength regions before conducting the main measurement. This preliminary action guides the subsequent measurement process to focus on relevant spectral features, ensuring no important data is missed while minimizing measurement time.

Inventive Principle:
Principle #10Preliminary action

3Measurement precision

If sampling interval is reduced to improve measurement accuracy, then measurement precision is improved, but measurement time increases

Engineering Contradiction:
Improvespectral measurement accuracyVSAvoidmeasurement period
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent optimizes sampling interval as a variable parameter based on the spectral features of target substances and measurement requirements. By adaptively adjusting the sampling interval rather than using a fixed small interval, the system achieves sufficient measurement precision while reducing the total number of measurement points and corresponding measurement time.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS12399063B2Spectroscopic analysis system and spectroscopic analysis method
Publication Date: 2025.08.26 HITACHI HIGH TECH ANALYSIS CORP
  • US12399063B2 patent drawing
  • US12399063B2 patent drawing
  • US12399063B2 patent drawing

AI summary

A spectroscopic analysis system includes: an operation panel configured to receive an input of at least one of an upper limit value of a measurement period of a spectroscopic analysis spectrum or a lower limit value of measurement accuracy as a user setting condition related to measurement of the spectroscopic analysis spectrum of a sample; and a control unit configured to derive a predetermined recommended measurement condition that satisfies the user setting condition and cause a display unit to display the recommended measurement condition, in which the recommended measurement condition is at least one of a wavelength range of light to be used for measurement of the spectroscopic analysis spectrum, a sampling interval of a wavelength of the light, a slit width of a diffraction grating of a spectroscope that disperses the light, or a sweep speed of the wavelength of the light.