Spectroscopic Characterization Device Correcting Translucent Material Interference

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Solution Overview

Problem

Characterization models in spectroscopy face high error rates when measuring samples through translucent materials like packaging, as these materials distort optical measurements, leading to inaccurate classification and quantification of samples.

Innovation Solution

A characterization device and method that corrects the measured spectrum by subtracting the spectrum of the translucent material from the sample spectrum, using a linear function and principal component analysis to reduce wavelength variables, thereby improving the accuracy of classification and quantification models.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If measurement is performed through translucent material (packaging), then sample characterization can be done on packaged products, but measurement accuracy deteriorates due to optical distortion

Engineering Contradiction:
Improveability to measure packaged samplesVSAvoidspectrum measurement accuracy
Core Design Contradiction:
Adaptability or versatilityVSMeasurement precision

Solution Approach 1:

The patent segments the measurement process into three distinct parts: (1) measuring the sample spectrum through packaging, (2) measuring the packaging material spectrum separately, and (3) subtracting the packaging spectrum from the sample spectrum to obtain the corrected sample spectrum. This segmentation allows the harmful effect of packaging to be isolated and removed mathematically.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent extracts the packaging material's spectral contribution from the combined measurement by performing a separate measurement of the packaging alone and then subtracting it from the sample-through-packaging measurement. This extraction isolates the sample's true spectral characteristics from the packaging interference.

Inventive Principle:
Principle #2Taking out (Extraction)

2Measurement precision

If spectrum correction is applied to remove packaging effects, then measurement accuracy improves, but device complexity increases due to additional measurement steps

Engineering Contradiction:
Improvecorrected spectrum accuracyVSAvoidmeasurement procedure complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The system performs self-calibration by automatically measuring the packaging spectrum and using it to correct subsequent sample measurements. The device stores the packaging spectrum in memory and applies automatic correction algorithms, reducing the need for manual intervention and making the complex process transparent to the user.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The packaging spectrum is measured and stored in advance before actual sample analysis begins. This preliminary measurement of the packaging material allows for rapid correction of subsequent sample measurements without repeating the packaging characterization process.

Inventive Principle:
Principle #10Preliminary action

3Measurement precision

If multiple wavelength variables are used for accurate characterization, then classification accuracy improves, but data processing complexity increases

Engineering Contradiction:
Improveclassification accuracyVSAvoiddata processing complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent transforms the spectral data from the wavelength domain to the principal component domain through mathematical transformation. This parameter change reduces the number of variables from hundreds of wavelength points to a few key principal components that capture the essential spectral information, simplifying subsequent classification while maintaining accuracy.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The method significantly reduces error rates, achieving robust characterization of samples even when measured through translucent materials, with error rates decreased to as low as 2% for certain packaging types, compared to initial rates of up to 78%.

Implementation Method 1

The different wavelengths are generated by a light source LS

Methodology Applied
Scientific EffectLight: Light

Implementation Method 2

the reflected (or transmitted) intensity is measured on a detector D

Methodology Applied
Scientific EffectPhotoelectric Effect: Photoelectric Effect

Implementation Method 3

their impact on the light illuminating the sample is not negligible, due to absorption, reflection and diffusion

Methodology Applied
Scientific EffectAbsorption (EM radiation): Absorption (EM radiation)

Implementation Method 4

their impact on the light illuminating the sample is not negligible, due to absorption, reflection and diffusion

Methodology Applied
Scientific EffectReflection: Reflection

Data Source

PatentEP3385703B1Improved spectroscopic device and method for sample characterization
Publication Date: 2024.09.04 SPORE BIOTECHNOLOGIES
  • EP3385703B1 patent drawingFigure 1~2
  • EP3385703B1 patent drawingFigure 3a~3c
  • EP3385703B1 patent drawingFigure 4a~4c

AI summary

The invention relates to a characterization device (50) for characterizing a sample (S) comprising: - a memory (MEM) storing a mesured spectrum (As+p) of said sample, performed through a translucent material, and a measured spectrum of the translucent material (Ap), - a processing unit (PU) configured to: * determine a spectral energy (Es+p) of the measured spectrum (As+p) of the sample through the translucent material (As+p), * estimate a coefficient (γ̂) from said spectral energy (Es+p) and, * determine a corrected spectrum (Âs) of the sample from the measured spectrum (As+p) of the sample through the translucent material and from a corrected spectrum of the translucent material (Âp), said corrected spectrum of the translucent material (Âp) being determined from the measured spectrum of the translucent material (Âp) and from the estimated coefficient (γ̂).