Spectroscopic Analysis Device Window Correction
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Solution Overview
Problem
Conventional spectroscopic analysis technologies do not accurately account for the effect of observation windows on optical property measurements, leading to inaccuracies when measuring objects at different positions relative to the window.
Innovation Solution
A spectroscopic analysis device that includes an irradiator, a light receiver, and a controller capable of acquiring environment information, including the observation window, and correcting optical property parameters based on this information to eliminate the window's effect.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional spectroscopic analysis is performed without correcting for observation window effects, then the measurement process is simple, but measurement precision deteriorates due to position-dependent inaccuracies
Solution Approach 1:
The system performs preliminary measurement of the observation window's optical properties before actual sample measurement. This preliminary action characterizes the window's effects (absorption, scattering, reflection) so that these effects can be subtracted from subsequent sample measurements, eliminating position-dependent inaccuracies without adding physical complexity to the measurement setup
Solution Approach 2:
The observation window itself is treated as an intermediary element whose optical properties are measured and characterized. By measuring the window's transmission and reflection characteristics separately, the system creates a correction model that accounts for the window's interference, allowing accurate sample measurements even when the window cannot be removed or replaced
2Adaptability or versatility
If reference materials and objects are measured at different positions relative to the observation window, then measurement flexibility is improved, but measurement precision deteriorates due to varying window effects
Solution Approach 1:
The system measures optical properties at multiple different positions relative to the observation window and uses these measurements to determine position-dependent correction parameters. By characterizing how the window's effects vary with position, the system can apply appropriate corrections regardless of where the sample is placed, thus maintaining both flexibility and precision
Solution Approach 2:
The system performs preliminary scanning measurements at various positions to map the observation window's optical effects across the measurement space. This preliminary positional characterization enables the system to automatically select or adjust correction parameters based on the actual measurement position, ensuring accurate results whether reference materials or samples are measured at different locations
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The device achieves more accurate optical property analysis by correcting for the observation window's effect, ensuring precise measurements even when reference materials and objects are measured at different positions.
Implementation Method 1
an irradiator configured to irradiate irradiation light on an object to be measured
Implementation Method 2
a light receiver configured to receive reflected light based on the irradiation light from the object to be measured
Data Source
AI summary
A spectroscopic analysis device (1) according to the present disclosure includes an irradiator (10) configured to irradiate irradiation light on an object to be measured, a light receiver (40) configured to receive reflected light based on the irradiation light from the object to be measured, and a controller (80) configured to analyze, based on the reflected light, an optical property of the object to be measured. The controller (80) is configured to acquire environment information on a measurement environment, including an observation window (W) that guides the irradiation light to the object to be measured, and to correct a parameter indicating the optical property according to the environment information.