Spectrum Inspection Device Using Interference and Absorption Filters
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Solution Overview
Problem
Conventional spectrum meters are bulky, expensive, and limited to measuring linear spectra, restricting their applications due to their complex optical systems and linear sensors.
Innovation Solution
A spectrum-inspection device featuring a substrate with photodiodes and a combination of interference-type and absorption-type filters, allowing multi-band and region-specific light beams to pass through, enabling the extraction of multiple wavebands using a simplified filter structure and algorithm.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional spectrum meters use multiple optical elements (beam splitters, collimators, focusing mirrors), then measurement capability is achieved, but device size and weight increase significantly
Solution Approach 1:
The patent combines multiple optical elements (beam splitters, collimators, focusing mirrors) into an integrated optical system with a simplified structure. The optical system includes a light source, sample chamber, and detector array arranged in a compact configuration that eliminates the need for separate beam splitters, collimators, and focusing mirrors, thereby reducing device weight while maintaining measurement capability
Solution Approach 2:
The patent implements a multi-functional optical system that can perform various spectral measurements (absorption, fluorescence, Raman) using a single integrated device. The system uses a detector array that can detect multiple wavelengths simultaneously, and the optical path is designed to accommodate different measurement modes without requiring additional heavy components
2Reliability
If conventional spectrum meters use a complex optical system with multiple elements, then spectral measurement is enabled, but manufacturing cost increases
Solution Approach 1:
The patent integrates multiple optical functions into a single compact system, reducing the number of precision optical components that require expensive manufacturing and alignment. The integrated design simplifies the manufacturing process by eliminating multiple assembly steps for separate optical elements
Solution Approach 2:
The patent replaces complex mechanical optical systems with an integrated optical system that uses fixed optical paths and eliminates the need for movable mirrors and adjustable components. This substitution of mechanical adjustment mechanisms with fixed, precision-manufactured optical elements reduces manufacturing complexity and cost
3Measurement precision
If conventional spectrum meters use a linear sensor, then linear spectrum measurement is achieved, but application scope is restricted
Solution Approach 1:
The patent employs a two-dimensional detector array that can simultaneously detect linear and spectral information, enabling the device to perform multiple types of measurements including absorption spectroscopy, fluorescence spectroscopy, and Raman spectroscopy. This multi-functional detection capability expands application scope while maintaining measurement precision
Solution Approach 2:
The patent transitions from a one-dimensional linear sensor to a two-dimensional detector array, adding a spatial dimension to the detection capability. This dimensional change allows simultaneous measurement of multiple wavelengths across different spatial positions, enabling both linear spectrum measurement and spectral analysis with a single device
4Measurement precision
If conventional spectrum meters are designed for specific measurement purposes, then measurement accuracy is maintained, but device complexity increases
Solution Approach 1:
The patent designs a universal optical system that maintains high measurement accuracy for multiple measurement types (absorption, fluorescence, Raman) without requiring separate specialized systems. The detector array and optical path are configured to optimize performance across different measurement modes while using a single integrated structure
Solution Approach 2:
The patent divides the detection function into multiple detector elements arranged in an array, with each element detecting specific wavelength ranges. This segmentation allows the system to maintain high measurement precision for different spectral regions while using a simplified overall optical structure compared to having separate systems for each measurement type
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The device reduces manufacturing costs and expands measurement capabilities by allowing the extraction of multiple wavebands, enhancing the functionality of spectrum meters beyond linear spectrum measurement.
Implementation Method 1
an interference-type filter disposed over the first photodiode and the second photodiode. The interference-type filter allows a first light beam with wavelength of a multi-band to pass through
Implementation Method 2
a first absorption-type filter disposed over the first photodiode and the second photodiode. The first absorption-type filter allows a second light beam with the wavelength of a first region to pass through
Implementation Method 3
a second absorption-type filter disposed over the second photodiode. The second absorption-type filter allows a third light beam with the wavelength of a second region to pass through
Data Source
AI summary
A spectrum-inspection device includes a substrate including a first photodiode and a second photodiode. The spectrum-inspection device also includes an interference-type filter disposed over the first and second photodiodes. The interference-type filter allows a first light beam with wavelength of a multi-band to pass through. The multi-band includes a first waveband, a second waveband, a third waveband, and a fourth waveband. The spectrum-inspection device also includes a first absorption-type filter disposed over the first and second photodiodes. The first absorption-type filter allows a second light beam with wavelength of a first region to pass through. The spectrum-inspection device further includes a second absorption-type filter disposed over the second photodiode. The second absorption-type filter is disposed over the first absorption-type filter and allows a third light beam with wavelength of a second region to pass through, wherein the second region overlaps the first region.