Spectrum Measurement Device Using Segmented Digital Micromirrors
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Current spectrometers face challenges in rapidly measuring the spectrum of large-area objects over a wide wavelength range without causing sample deterioration due to high-energy irradiation, which affects measurement results.
Innovation Solution
A detecting system comprising a sampling module with at least two spectrum measurement devices, each equipped with a digital micromirror device, that simultaneously measures different portions of the illumination light waveband, allowing for rapid spectrum detection across a wide wavelength range by distributing the measurement burden across multiple devices.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a single spectrometer is used to measure the spectrum over a wide wavelength range, then the measurement covers all necessary wavelengths, but the measurement time increases and causes sample deterioration due to prolonged high-energy irradiation
Solution Approach 1:
The patent divides the wide wavelength range measurement task into multiple segments by using multiple spectrometers, each equipped with a digital micromirror device that detects a specific wavelength portion. This segmentation allows simultaneous measurement of different wavelength ranges, reducing total measurement time and minimizing sample deterioration from prolonged irradiation.
2Measurement precision
If high-energy beam is used to obtain spectrum over wide wavelength range, then the spectrum measurement coverage is improved, but the sample deteriorates due to high temperature
Solution Approach 1:
The patent segments the wavelength detection across multiple spectrometers, allowing the system to acquire complete spectral information faster. This reduces the duration of high-energy beam exposure on the sample, thereby minimizing thermal damage and deterioration while maintaining comprehensive wavelength coverage.
Solution Approach 2:
The patent implements continuous simultaneous measurement across multiple wavelength portions using parallel spectrometers. This continuous parallel acquisition eliminates the need for sequential scanning, reducing total exposure time and minimizing cumulative thermal damage to the sample while maintaining complete spectral coverage.
3Productivity
If multiple spectrum measurement devices are used to measure different wavelength portions simultaneously, then the measurement speed increases and sample deterioration is reduced, but the device complexity increases
Solution Approach 1:
The patent divides the spectral measurement task across multiple spectrometers, each handling a specific wavelength portion. This segmentation enables parallel simultaneous measurement, dramatically increasing measurement speed and productivity while the modular architecture manages system complexity through standardized components.
Solution Approach 2:
The patent employs multiple spectrometers with identical or similar digital micromirror device structures, each configured for a specific wavelength range. This universal design approach allows the system to achieve multi-wavelength coverage through replicated modular units, increasing measurement speed while keeping individual device complexity manageable through standardization.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables rapid and efficient spectrum measurement across a wide wavelength range, reducing the time the sample is irradiated and minimizing sample deterioration, while also allowing for selectable wavelength detection from UV to near-infrared, thus improving measurement efficiency and accuracy.
Implementation Method 1
the first spectrum measurement device includes a digital micromirror device... the at least two measurement beams include a first measurement beam transmitted to the first spectrum measurement device
Data Source
AI summary
A detecting system using a spectrum measurement device and detecting an object is provided. The system includes: a sampling module and spectrum measurement devices assembled to the sampling module. The sampling module provides an illumination beam to the object and collects measurement beams reflected by the object to the spectrum measurement devices. The illumination beam has an illumination light waveband. The measurement beams have the illumination light waveband. The spectrum measurement devices include first and second spectrum measurement devices. The first spectrum measurement device includes a digital micromirror device. The measurement beams include first and second measurement beams transmitted to the first and second spectrum measurement devices respectively. The first spectrum measurement device detects a portion of the illumination light waveband of the first measurement beam, and at the same time the second spectrum measurement device detects another portion of the illumination light waveband of the second measurement beam.