SPFS Detection Chip Alignment Using Angle-Selective Light Reflection
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Solution Overview
Problem
The existing method for aligning detection chips in Surface Plasmon Field Enhanced Fluorescence Spectroscopy (SPFS) is prone to inaccuracies due to stray light from internal reflections within the dielectric member, leading to incorrect chip alignment and detection results.
Innovation Solution
A detection method and device that utilize a specific configuration of the detection chip and light path, where the irradiation angle of excitation light is adjusted to ensure only second reflection light, which is not internally reflected, is detected by the light receiving sensor, allowing for accurate chip alignment and reducing stray light interference.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the detection chip is moved while emitting excitation light toward the dielectric member to align the chip, then the location information of the detection chip can be acquired based on the quantity of light received by the light receiving sensor, but light internally reflected in the dielectric member might reach the light receiving sensor causing unexpected detection results and reducing alignment accuracy
Solution Approach 1:
The patent extracts and removes the harmful internally reflected light from the detection path by configuring the light receiving sensor to detect only externally reflected light at specific angles, excluding the internally reflected stray light that would otherwise interfere with alignment accuracy
Solution Approach 2:
The patent applies local quality by directing excitation light at specific angles (45-60 degrees) to create different reflection paths: externally reflected light is directed toward the light receiving sensor while internally reflected light is directed away, allowing the sensor to receive only the useful signal
2Measurement precision
If the incident angle of the excitation light with respect to the metal film is adjusted with high accuracy to correctly detect the amount of detection object substance, then detection sensitivity is improved, but the incident angle cannot be adjusted with high accuracy when the position of the detection chip is shifted
Solution Approach 1:
The patent performs preliminary alignment action by using externally reflected light to first align the detection chip to a predetermined position before conducting the actual fluorescence detection, ensuring the chip is properly positioned without requiring high user skill
Solution Approach 2:
The patent implements feedback by using the light receiving sensor to detect the quantity of externally reflected light and provide location information about the detection chip position, allowing the system to automatically adjust and confirm proper alignment before measurement
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables accurate alignment and detection of the detection chip, suppressing the reduction in alignment accuracy caused by internally reflected light and improving the reliability of detecting the presence or amount of the detection object substance.
Implementation Method 1
When the metal film is irradiated with excitation light through the dielectric member at an angle that causes surface plasmon resonance, localized light (enhanced electric field) can be generated on the surface of the metal film
Implementation Method 2
a fluorescence material labelling the detection object substance captured on the metal film is excited, and therefore the presence or the amount of the detection object substance can be detected by detecting the fluorescence emitted from the fluorescence material
Implementation Method 3
the reflection light of excitation light reflected by the dielectric member is detected by a light receiving sensor. Then, the location information of the detection chip is acquired based on the quantity of the light received by the light receiving sensor
Data Source
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AI summary
In the detection method according to the present invention, a light irradiation angle is set with respect to a first surface so as to detect only either first reflected light reflected at a first surface or second reflected light that has penetrated the first surface and has been reflected at a second surface and a third surface in series. Then, light is emitted from a light irradiation part at the set irradiation angle while a detection chip is kept in motion, either the first reflected light or the second reflected light is detected by a reflected light detection part, and positional information of the detection chip is acquired on the basis of the result of the detection of the first or second reflected light. The detection chip is moved, on the basis of the acquired positional information, to a detection position where detection of a substance to be detected is performed. While the detection chip is kept at the detection position, detection of the substance to be detected is performed through detection of sample light.