Spherical Aberration Correction Matrix for Microscopy
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Solution Overview
Problem
Current methods for correcting spherical aberration in microscopy, especially in multichannel, multiposition, and three-dimensional experiments, require numerous time-consuming recordings, leading to increased phototoxicity and limited time resolution, as they often necessitate manual adjustments and multiple measurements at each position and wavelength, which is impractical for dynamic specimens.
Innovation Solution
A procedure that stores correction values in a matrix as a function of recording position, time, and wavelength, allowing interpolation between defined grid points to determine correction values, enabling rapid and accurate spherical aberration correction at each position, reducing the need for extensive measurements and minimizing phototoxicity.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If multiple micrograph recordings are taken to determine spherical aberration correction values, then correction precision is improved, but examination time increases and time resolution is limited
Solution Approach 1:
The patent applies preliminary action by pre-determining spherical aberration correction values at discrete grid positions before actual imaging experiments. A correction matrix is pre-calculated and stored, allowing rapid retrieval during time-sensitive experiments without performing measurements during the critical observation period.
Solution Approach 2:
The patent segments the continuous space of possible correction values into a discrete grid matrix with specific sampling points. By measuring only at these discrete grid positions rather than continuously, the system reduces the number of measurements required while maintaining correction accuracy through interpolation between grid points.
2Measurement precision
If numerous recordings are performed to map spherical aberration across multiple positions and wavelengths, then correction accuracy is improved, but phototoxicity to the specimen increases
Solution Approach 1:
The patent applies partial action by determining correction values at a subset of grid points rather than exhaustively mapping every possible position and wavelength combination. The correction matrix is sparsely sampled at strategic grid points, and interpolation provides correction values for intermediate positions, reducing total light exposure while maintaining adequate correction accuracy.
3Manufacturing precision
If spherical aberration is corrected at each individual position and wavelength channel, then correction quality is improved, but the number of recordings and phototoxicity increase proportionally
Solution Approach 1:
The patent creates a universal correction matrix that serves multiple fluorescence channels and positions simultaneously. By determining correction values at grid points that account for spatial and spectral variations, a single correction matrix can be applied across multiple wavelength channels, reducing the need for separate measurements in each channel while maintaining correction quality.
4Adaptability or versatility
If manual adjustment of spherical aberration correction is performed, then flexibility is maintained, but the process becomes impractical for multiposition and multiposition experiments
Solution Approach 1:
The patent implements self-service by creating an automated correction system where the microscope automatically retrieves appropriate correction values from the pre-calculated matrix based on current imaging parameters. The system self-adjusts correction settings without requiring manual intervention, making multiposition and multiposition experiments practical while maintaining adaptability to different experimental conditions.
Data Source
AI summary
A procedure for the correction of spherical aberration in microscopic applications, wherein various recordings of a specimen to be observed are taken and evaluated for the purpose of changing the setting values of the optical system. The correction values are stored in a correction matrix as a function of the recording position, the recording time, the wavelength, and the temperature, wherein the determination and storage of the correction values are carried out in each recording position in the x, y, and z coordinates, and/or the correction values are determined after a selection of grid points by interpolation, so that the correction values of the interpolated correction matrix are the starting values for the subsequent exact determination by measurement.