Spherical Alignment Tip for Full 3D Angular Alignment
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Solution Overview
Problem
Existing alignment techniques for sample characterization devices using two-dimensional reference objects are inadequate for full angular alignment, costly, and not suitable for various applications, with fragile three-dimensional objects being difficult to reproduce.
Innovation Solution
An alignment tip with an essentially spherical alignment head made of high atomic weight material, connected to a body, allowing three-dimensional alignment and compatible with different measuring devices, manufactured through electrochemical methods.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If two-dimensional reference objects (crosses, Siemens patterns) are used for alignment, then alignment in lines of light can be achieved, but full angular alignment is insufficient and measurement accuracy deteriorates
Solution Approach 1:
The patent transitions from two-dimensional reference objects (crosses, Siemens patterns) to a three-dimensional spherical reference object. The sphere enables alignment along three rotational axes (omega, kappa, chi) in space, providing complete angular alignment capability that 2D objects cannot achieve. This dimensional change resolves the contradiction by enabling full angular alignment while maintaining measurement precision.
Solution Approach 2:
The patent employs a spherical alignment head instead of planar reference structures. The sphere's curved surface allows the reference object to be turned in any direction in space and provides isotropic scattering characteristics that work equally well for beams incident from any angle, enabling accurate alignment regardless of beam orientation.
2Measurement precision
If expensive reference objects (Siemens patterns, stars) are used for high-resolution alignment, then nanometer-level alignment is achieved, but cost increases significantly
Solution Approach 1:
The patent describes manufacturing the spherical alignment head by melting the tip of a tungsten wire using a laser, a simple and inexpensive process compared to fabricating Siemens patterns or star references. This approach achieves the desired alignment precision at a fraction of the cost of conventional reference objects.
Solution Approach 2:
The patent changes the material parameter by using tungsten (high atomic weight, Z=74) which provides strong scattering contrast for X-ray and electron beams. This material parameter change enables high-precision alignment without requiring complex structures, thereby reducing manufacturing cost while maintaining nanometer-level alignment capability.
3Measurement precision
If three-dimensional test objects (porous silicon dioxide) are used for ptychographic measurements, then isotropic 3D resolution is achieved, but the objects are fragile and manufacturing is not reproducible
Solution Approach 1:
The patent uses a solid tungsten sphere instead of porous silicon dioxide structures. Tungsten provides mechanical strength and structural integrity while maintaining the scattering properties needed for high-resolution ptychographic measurements. This material substitution resolves the contradiction by providing both the 3D resolution capability and the durability required for reliable, reproducible measurements.
Solution Approach 2:
The spherical geometry of the alignment head provides isotropic scattering characteristics that enable 3D resolution measurements from multiple angles, similar to porous silicon dioxide structures. However, the solid spherical form factor provides mechanical strength and ease of handling, eliminating the fragility issue while maintaining the ability to achieve isotropic resolution.
4Ease of operation
If two-dimensional reference objects are used for alignment, then alignment in specific directions can be achieved, but alignment along all three rotational axes is not possible
Solution Approach 1:
The patent employs a three-dimensional spherical reference object that can be rotated and observed from all directions, enabling alignment along three rotational axes (omega, kappa, chi). This 3D approach completes the alignment system by providing reference signals for all necessary rotational movements, unlike 2D objects that only provide alignment in specific directions.
Solution Approach 2:
The spherical alignment head serves multiple functions: it provides alignment references for all three rotational axes, acts as a scattering center for beam positioning, and can be used in various measurement modes (diffraction, imaging, ptychography). This multi-functionality simplifies the overall alignment system while achieving complete angular alignment capability.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Improves alignment accuracy, reduces measurement time and cost, and enables versatile use across various characterization devices, including cryogenic and high-radiation environments.
Implementation Method 1
the alignment tip comprising: an alignment head that is made of a material having an atomic weight greater than 50 and has an essentially spherical shape
Data Source
AI summary
An alignment tip for a sample characterization device, the alignment tip includes an alignment head that is made of a material having an atomic weight greater than 50 and has an essentially spherical shape, and a body that is connected to the alignment head and is configured to be placed in a sample support.