Spike Neural Network Circuit Radiation Source Leakage Current

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Solution Overview

Problem

Spike neural network circuits face arithmetic errors due to increasing leakage current in transistors as the number of transistors increases, affecting the accuracy of processing spike signals.

Innovation Solution

Incorporating a radiation source attached to the substrate of the synapse circuit to increase the threshold voltages of transistors, thereby reducing leakage current and minimizing computation errors.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If the number of transistors is increased to process more information, then the processing capability is improved, but the leakage current increases causing arithmetic errors

Engineering Contradiction:
Improveprocessing capabilityVSAvoidarithmetic accuracy
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The patent applies parameter changes by modifying the threshold voltage parameter of the transistors. Specifically, it uses ion implantation to change the threshold voltage from a first value to a second value, thereby reducing leakage current while maintaining the increased transistor count for higher processing capability

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent replaces conventional electrical control methods with a physical ion implantation process. Instead of using electrical fields or control circuits to manage leakage current, it employs ion beams to physically modify the transistor characteristics, achieving more effective leakage current reduction

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Reliability

If the threshold voltage is increased to reduce leakage current, then the reliability is improved, but the processing capability may be affected

Engineering Contradiction:
Improveleakage current reductionVSAvoidprocessing capability
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent carefully controls the threshold voltage parameter change through ion implantation. By adjusting implantation conditions (ion type, energy, dose), it achieves the optimal balance where threshold voltage increases sufficiently to reduce leakage current while maintaining processing capability

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent applies local quality by selectively implanting ions at specific locations and depths within the transistor structure. Different regions of the transistor receive different ion implantation treatments, allowing localized optimization of threshold voltage without uniformly degrading processing capability

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The introduction of a radiation source effectively reduces leakage current in transistors, enhancing the accuracy of spike signal processing and reducing computation errors in spike neural network circuits.

Implementation Method 1

a radiation source attached to a substrate on which the synapse is formed, configured to output radiation particles to the synapse

Methodology Applied
Scientific EffectRadiation particles interaction with semiconductor material: Radiation

Data Source

PatentUS11403515B2Spike neural network circuit including radiation source
Publication Date: 2022.08.02 ELECTRONICS & TELECOMM RES INST
  • US11403515B2 patent drawing
  • US11403515B2 patent drawing
  • US11403515B2 patent drawing

AI summary

Provided is a spike neural network circuit. The spike neural network circuit includes an axon configured to generate an input spike signal, a synapse including a first transistor for outputting a current according to a weight and a second transistor connected to the first transistor and outputting the current according to an input spike signal, a neuron configured to compare a value according to the current output from the synapse with a reference value and generate an output spike signal based on a comparison result, and a radiation source attached to a substrate on which the synapse is formed, configured to output radiation particles to the synapse, and configured to increase magnitudes of threshold voltages of the first and second transistors of the synapse.