SPIM Microscope Imaging System Astigmatism Reduction

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Solution Overview

Problem

Conventional SPIM microscopes face challenges in reducing astigmatism of observation light when the emission and observation optical systems are inclined, leading to reduced throughput during sample scanning.

Innovation Solution

Incorporating a non-axisymmetric optical element, such as a wedge prism or cylindrical lens, in the imaging optical system to bend light beams on one axis without affecting the other, thereby reducing astigmatism and improving image quality even when the observation axis is inclined.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If the emission optical system and observation optical system are inclined with respect to the sample arrangement surface to reduce astigmatism, then image quality improves, but sample scanning becomes difficult and throughput decreases

Engineering Contradiction:
Improveimage qualityVSAvoidthroughput
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The optical system is segmented into distinct functional modules: emission optical system, observation optical system, and scanning unit. This segmentation allows independent optimization of each subsystem - the emission and observation systems can be inclined for optimal image quality while the scanning unit operates independently to maintain throughput.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The scanning unit is designed to dynamically scan the sample in one direction through the emission surface, enabling the system to maintain high throughput even with inclined optical axes. The dynamic scanning capability compensates for the geometric constraints imposed by the inclined configuration.

Inventive Principle:
Principle #15Dynamics

2Measurement precision

If the observation axis is inclined with respect to the emission surface, then astigmatism is reduced, but optical system complexity increases

Engineering Contradiction:
Improveastigmatism reductionVSAvoidoptical system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent deliberately introduces asymmetry by inclining the observation axis at a specific angle (e.g., 45 degrees) with respect to the emission surface. This asymmetric configuration is optimized to reduce astigmatism while the scanning unit compensates for the increased complexity by providing a straightforward scanning mechanism.

Inventive Principle:
Principle #4Asymmetry

3Measurement precision

If an immersion objective lens is used to reduce astigmatism, then image quality improves, but sample scanning capability is lost

Engineering Contradiction:
Improveimage qualityVSAvoidsample scanning capability
Core Design Contradiction:
Measurement precisionVSAdaptability or versatility

Solution Approach 1:

The system separates the immersion objective lens function from the scanning function into distinct modules. The immersion objective lens is dedicated to high-quality imaging without scanning capability, while the scanning unit independently handles sample scanning, allowing both functions to be optimized separately and work together effectively.

Inventive Principle:
Principle #1Segmentation

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration effectively minimizes astigmatism and enhances image quality, securing resolution and field of view stability, while allowing for efficient scanning and image acquisition.

Implementation Method 1

The imaging optical system has a non-axisymmetric optical element that bends a light beam on one axis of the observation light but does not bend a light beam on the other axis

Methodology Applied
Scientific EffectRefraction: Refraction

Data Source

PatentEP3779555B1Sample observation device
Publication Date: 2024.04.17 HAMAMATSU PHOTONICS KK
  • EP3779555B1 patent drawingFigure 1
  • EP3779555B1 patent drawingFigure 2
  • EP3779555B1 patent drawingFigure 3(A)~3(B)

AI summary

A sample observation device 1 includes: an emission optical system 3 that emits planar light L2 to a sample S; a scanning unit 4 that scans the sample S in one direction so as to pass through an emission surface R of the planar light L2; an imaging optical system 5 that has an observation axis P2 inclined with respect to the emission surface R and forms an image of observation light L3 generated in the sample S by emission of the planar light L2; an image acquisition unit 6 that acquires image data 31 corresponding to an optical image of the observation light L3 formed by the imaging optical system 5; and an image generation unit 8 that generates observation image data 32 of the sample S based on the image data 31 acquired by the image acquisition unit 6. The imaging optical system 5 has a non-axisymmetric optical element that bends a light beam L3a on one axis of the observation light L3 but does not bend a light beam L3b on the other axis perpendicular to the one axis.