SPIM Microscope Sequential Light Sheet Galvanometer Scanner
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Solution Overview
Problem
Existing SPIM microscopes face limitations in flexibility, resolution, and the generation of 3-dimensional images due to fixed focus and scattering artifacts, which hinder high-resolution imaging of biological samples without damaging them.
Innovation Solution
The implementation of a SPIM-microscope with a zoom optics system that allows for adjustable focal length and sequential light sheet generation in the x-direction, combined with confocal detection and multiphoton illumination, enables flexible imaging and higher resolution along the z-direction while reducing scattering artifacts.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Volume of moving object
If a cylindrical lens is used to generate a light sheet with a long focus to increase the illuminated volume, then the illuminated volume is larger, but the resolution in the z-direction is decreased
Solution Approach 1:
The patent applies dynamics by replacing the fixed focus cylindrical lens with a galvanometer scanner that dynamically moves the illumination beam across the sample. This allows the light sheet to be scanned through different z-positions, enabling the system to achieve both a large illuminated volume and high resolution in the z-direction by sequentially imaging at different focal planes.
2Volume of moving object
If a long focus is used to increase the illuminated volume, then the illuminated volume is larger, but the optical resolution along the optical axis is low
Solution Approach 1:
The galvanometer scanner enables dynamic adjustment of the illumination beam position, allowing the system to scan through the sample volume and reconstruct high-resolution 3D images from multiple 2D images taken at different z-positions, thereby achieving high optical resolution along the optical axis while maintaining a large illuminated volume.
3Device complexity
If a fixed focus cylindrical lens is used, then the system is simpler, but the flexibility is reduced due to predetermined focus
Solution Approach 1:
The patent replaces the fixed focus cylindrical lens with a galvanometer scanner that can dynamically adjust the illumination beam position and focus position. This dynamic system provides greater flexibility to image different regions and depths of the sample while maintaining reasonable system complexity through the use of standard scanning components.
4Quantity of substance
If illumination light is sent through a thick sample, then more information can be captured, but scattering artifacts and absorption artifacts are generated
Solution Approach 1:
The galvanometer scanner enables the illumination beam to sweep through thin slices at different z-positions, allowing the system to capture information from throughout the sample by stacking multiple thin images. This approach reduces scattering and absorption artifacts compared to illuminating the entire thick sample at once, while still capturing comprehensive 3D information.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enhances the flexibility and resolution of SPIM microscopy, allowing for the generation of high-resolution 3-dimensional images with reduced scattering artifacts, enabling detailed imaging of biological samples without causing damage.
Implementation Method 1
Scattering artifacts and absorption artifacts should be avoided that may occur due to interaction of the illumination light with the sample
Implementation Method 2
a camera detecting in a z-direction as a first detection direction light emanating from the object as fluorescent light and/or as reflected light
Data Source
AI summary
A SPIM-microscope (Selective Plane Imaging Microscope) having a y-direction illumination light source and a z-direction detection light camera. An x-scanner generates a sequential light sheet by scanning the illumination light beam in the x-direction. The SPIM-microscope has an illumination optics having a zoom optics provided in a beam path of the illumination light beam, the zoom optics being adapted to change the focal length of the illumination light beam and adapted to detect a larger area of the object by sequentially detecting sequences of images along the y-direction that have an increased resolution along the z-direction. An image processing unit combines these sequences of images by image stitching into one large overall image.