SPIM Microscope Optical Axis Configuration for 3D Data Conversion
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Solution Overview
Problem
Conventional SPIM microscopes face difficulties in converting obtained image data into three-dimensional data in real space due to the perpendicular configuration of the emission and observation optical systems.
Innovation Solution
A sample observation device with an emission optical system that emits planar light and an imaging optical system with an inclined optical axis, allowing for high-throughput acquisition of image data by shifting image acquisition regions, enabling easy conversion of image data into three-dimensional data.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If the emission optical system and observation optical system are configured perpendicular to each other with respect to the sample arrangement surface, then the device structure is simplified and manufacturing is easier, but converting image data into three-dimensional data in real space becomes difficult
Solution Approach 1:
The patent applies asymmetry by configuring the emission optical system and observation optical system with different inclination angles (θ1 and θ2) relative to the normal of the scanning surface, rather than using a symmetric perpendicular configuration. This asymmetric arrangement enables accurate three-dimensional data conversion while maintaining manufacturing feasibility.
Solution Approach 2:
The patent changes the angular parameters of the optical systems by specifying that both θ1 and θ2 are 80° or less and their sum is 100° or more. This parameter optimization resolves the contradiction by enabling three-dimensional data conversion while keeping the device structure manufacturable.
2Device complexity
If the optical axis of the imaging optical system is perpendicular to the scanning surface, then the device complexity is reduced, but the throughput of image data acquisition decreases
Solution Approach 1:
The patent introduces angular inclination in the optical system configuration, transitioning from a perpendicular (one-dimensional simplification) to an inclined (adding angular dimension) arrangement. This enables high-throughput acquisition by capturing image data along the optical axis direction of planar light while maintaining manageable device complexity.
3Device complexity
If the image acquisition region is fixed for all pixels, then the device structure is simpler, but the ability to convert image data into three-dimensional data in real space is reduced
Solution Approach 1:
The patent implements dynamics by making the image acquisition region variable across pixels, where each pixel captures a shifted region according to the scanning amount. This dynamic adjustment enables precise three-dimensional data conversion while keeping the device structure relatively simple through software-controlled pixel region assignment.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables efficient conversion of image data into three-dimensional data in real space with improved throughput and reduced defocus, enhancing the analysis and observation capabilities.
Implementation Method 1
an image of fluorescence or scattered light generated inside the sample is formed on the image forming surface
Implementation Method 2
an image of fluorescence or scattered light generated inside the sample is formed on the image forming surface
Data Source
Figure 1
Figure 2
Figure 3~3(b)
AI summary
In a sample observation device 1, when the angle formed by an optical axis P1 of an emission optical system 3 and a normal P3 of a scanning surface K is θ1 and the angle formed by an optical axis P2 of an imaging optical system 5 and the normal P3 of the scanning surface K is θ2, both θ1 and θ2 are 80° or less, and θ1 + θ2 is 100° or more. In an image acquisition unit 6, an image acquisition region Fn+1, m+1 in the (m+1)-th frame of the (n+1)-th pixel is shifted from an image acquisition region Fn, m in the m-th frame of the n-th pixel in a scanning direction of a sample S according to the scanning amount V of the sample S in the exposure time of one frame.