Spin Cup Geometry for Wafer Cleaning Mist Suppression
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Solution Overview
Problem
During the cleaning of semiconductor wafers using a spin cleaning apparatus, a portion of the cleaning solution mist is bounced and adhered to the wafer surface, leading to chemical reactions and light point defects, which reduce yield.
Innovation Solution
A cleaning apparatus with a spin cup having an annular side wall, an inclined portion, and a bent portion is designed. The spin cup's geometry, including the inclination angle and width of the inclined portion, is optimized to prevent mist from adhering to the wafer by ensuring it is exhausted through a gap between the spin cup and the rotating table.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Loss of substance
If a spin cup is used to collect scattered cleaning solution, then cleaning solution can be contained, but mist is bounced and adhered to the wafer surface causing light point defects
Solution Approach 1:
The spin cup includes an inclined portion that extends upward from the side wall, creating a three-dimensional structure that intercepts mist in the vertical dimension before it can bounce off the side wall and adhere to the wafer. This upward extension adds a new spatial dimension to the containment approach.
Solution Approach 2:
The inclined portion acts as an intermediary element between the side wall and the wafer. It intercepts and redirects the mist flow, preventing direct contact between the bounced mist and the wafer surface, thus serving as a mediating structure that resolves the harmful effect.
2Quantity of substance
If the spin cup side wall is positioned high to collect mist, then more mist is captured, but mist bounces off the side wall and adheres to the wafer
Solution Approach 1:
Instead of simply increasing the height of the vertical side wall, the invention adds an upwardly extending inclined portion that creates a sloped surface. This introduces a dimensional transition that allows mist to be captured and redirected along the incline rather than bouncing vertically back toward the wafer.
Solution Approach 2:
The inclined portion provides a sloped, curved surface that redirects mist flow in a controlled manner. The angular transition from vertical to sloped surface creates a smooth flow path that prevents abrupt bouncing and redirects mist away from the wafer while maintaining effective containment.
3Productivity
If cleaning solution is sprayed at high rate to clean wafer effectively, then cleaning performance improves, but more mist is generated and scattered
Solution Approach 1:
The invention converts the harmful scattered mist generated by high-rate cleaning into a controlled flow that is redirected by the inclined portion. The mist that would normally bounce harmfully is instead channeled along the slope and contained, transforming a harmful byproduct into a controlled element.
Solution Approach 2:
The inclined portion serves as an intermediary structure that intercepts the mist generated during high-efficiency cleaning. It provides a transition zone that captures and redirects the mist flow, allowing high-rate cleaning to proceed while preventing harmful mist adhesion to the wafer.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The optimized spin cup design effectively prevents the cleaning solution mist from adhering to the semiconductor wafer, reducing light point defects and improving yield.
Implementation Method 1
a gas supply portion that is provided in an upper part of the chamber and supplies a gas downward
Implementation Method 2
the cleaning solutions are scattered as a fine mist (hereinafter may simply be referred to as a 'mist') outward in radial directions of the semiconductor wafer by centrifugal force
Data Source
AI summary
Provided is a cleaning apparatus and a cleaning method for semiconductor wafers that can hinder a mist of a cleaning solution from being adhered to a surface of a semiconductor wafer during cleaning of the semiconductor wafer. In a cleaning apparatus 1 for a semiconductor wafer, a spin cup 20 has an annular side wall portion 21; an inclined portion 22 that is inclined toward the rotating table 13; and an annular bent portion 23. The height position h21 of the upper end portion 21c of the side wall portion 21 is set at a position lower than the height position h14a of the upper end portion 14a of the wafer retainer portion 14, and the inclination angle θ22 of the inclined portion to a horizontal plane and the width w of the inclined portion satisfy a formula (A):θ22(°)≥−0.65×w(mm)+72.9° (A).


