Spinning Laser Beam Inspection for Spherical Surfaces

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Solution Overview

Problem

Current methods for inspecting optical components with curved surfaces lack the sensitivity and throughput to detect small imperfections, relying on subjective human observation and being inadequate for high-quality standards, especially for spherical, near-spherical, and aspherical surfaces.

Innovation Solution

A method and apparatus utilizing a spinning laser beam with constant incidence angle and controlled motion to scan spherical surfaces, collecting and classifying scattered radiation for precise defect detection and classification, enabling high-speed and high-accuracy inspection.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If automated inspection systems are implemented, then productivity and measurement precision are improved, but device complexity increases

Engineering Contradiction:
Improveinspection throughputVSAvoidsystem complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The inspection system is divided into independent functional modules: illumination source, beam shaping optics, scanning mechanism, detection system, and control unit. Each module performs a specific function and can be independently optimized or replaced, reducing overall system complexity while maintaining high productivity.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system uses variable parameters such as beam width, scanning speed, and detection sensitivity that can be adjusted based on the specific inspection requirements. This allows the same apparatus to handle different defect sizes and surface types without requiring complete system redesign, thereby improving productivity without proportionally increasing complexity.

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If high sensitivity detection is used to detect small imperfections, then measurement precision is improved, but device complexity increases

Engineering Contradiction:
Improvedefect detection sensitivityVSAvoiddetection system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The illumination system provides localized high-intensity lighting at the beam spot on the workpiece surface, concentrating optical energy only where needed for detection. This local quality approach enables high measurement precision for small defects without requiring the entire system to be overly complex or energy-intensive.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

A beam shaping element is introduced as an intermediary component between the illumination source and the workpiece surface. This element conditions the light beam to achieve optimal spot size and intensity distribution, enabling high defect detection sensitivity while using a relatively simple and cost-effective illumination source.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Measurement precision

If constant angle of incidence is maintained during scanning, then measurement consistency is improved, but ease of operation deteriorates

Engineering Contradiction:
Improveinspection consistencyVSAvoidalignment complexity
Core Design Contradiction:
Measurement precisionVSEase of operation

Solution Approach 1:

The system is designed to work with spherical or curved workpiece surfaces by maintaining the beam incident angle constant relative to the local surface normal at each scan position. This geometric approach ensures measurement consistency across curved surfaces without requiring complex real-time angle adjustment mechanisms, thereby preserving ease of operation.

Inventive Principle:
Principle #14Spheroidality (Curvature)

Solution Approach 2:

The control unit receives position information from the scanning mechanism and automatically adjusts the illumination and detection angles to maintain constant incidence relative to the surface normal. This feedback mechanism ensures measurement consistency while automating the alignment process, reducing the operational burden on the user.

Inventive Principle:
Principle #23Feedback

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enhances defect detectability and classification on curved surfaces, providing consistent and objective inspection results comparable to flat wafer inspection systems, improving the quality control of optical components.

Implementation Method 1

A method is disclosed wherein an inspected surface of an object is scanned with a beam of electromagnetic radiation in the result of spinning the beam about a spin axis, the spin axis being directed normally towards the surface and passing through a center of a sphere making up the inspected spherical surface so that an angle of incidence of the beam at the surface is constant during the scanning

Methodology Applied
Scientific EffectLight scattering: Scattering

Implementation Method 2

A portion of electromagnetic radiation scattered at the surface features and imperfections is collected by an optical system set in a fixed mechanical relationship with the beam and also spinning about the spin axis

Methodology Applied
Scientific EffectElectromagnetic radiation collection: Reflection

Data Source

PatentUS11047675B2Method and apparatus for inspection of spherical surfaces
Publication Date: 2021.06.29 PEIDOUS VALERIE
  • US11047675B2 patent drawing
  • US11047675B2 patent drawing
  • US11047675B2 patent drawing

AI summary

Disclosed are a method and an apparatus for inspection of workpieces and products having curved and, in particular, spherical surfaces. The method is based on scanning inspected objects with a narrow probing beam of electromagnetic radiation and concurrently measuring the radiation scattered on the surface. The method and apparatus improve the detectability of features and imperfections on inspected surfaces by providing invariable parameters and conditions of scanning, robust mechanical stability of scanning systems, high positioning accuracy of the probing electromagnetic beam and efficient collection of the scattered radiation. The apparatus allows surface defect classification, determining defect dimensions and convenient automation of inspection.