Split-Ring Resonator Defect Sensing for Sub-Wavelength Imaging

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Solution Overview

Problem

Current nondestructive evaluation methods lack effective means to detect defects in materials at a sub-wavelength scale without causing damage, particularly in composite and additive manufactured metals, where existing techniques are limited in resolution and accuracy.

Innovation Solution

The use of split-ring resonators (SRRs) integrated with a microstrip transmission line, where multiple SRR cells resonate at different frequencies, allowing for dynamic tuning and high-resolution detection through frequency shifts when interacting with samples, and a reference SRR for calibration, enabling sub-wavelength defect detection without destructive interference.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional nondestructive evaluation methods are used, then materials can be assessed without damage, but detection resolution and accuracy are limited and cannot detect sub-wavelength defects

Engineering Contradiction:
Improvedefect detection resolutionVSAvoiddetection capability for sub-wavelength defects
Core Design Contradiction:
Measurement precisionVSDifficulty of detecting and measuring

Solution Approach 1:

The evaluation system is segmented into multiple SRR sensors with different resonant frequencies, each sensitive to different defect sizes. This segmentation allows the system to detect sub-wavelength defects by combining information from multiple frequency bands, overcoming the limitation of single-frequency methods.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system employs dynamic tuning of SRR resonant frequencies to adapt to different detection requirements. By adjusting the resonant frequencies of multiple SRRs, the system can dynamically optimize its sensitivity for detecting defects of various sizes, thereby improving measurement precision for sub-wavelength defects.

Inventive Principle:
Principle #15Dynamics

2Measurement precision

If multiple SRR cells with different resonant frequencies are used, then detection sensitivity and resolution are improved, but device complexity increases

Engineering Contradiction:
Improvedetection sensitivityVSAvoidnumber of SRR cells and frequencies
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

Each SRR cell is designed to serve multiple functions: it acts as both a sensing element and a frequency-selective filter. The multiple SRRs with different resonant frequencies work together as an integrated multi-functional system, where each component contributes to both detection sensitivity and frequency discrimination, reducing overall system complexity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

Multiple SRR cells are merged into a single integrated sensing system that operates across multiple frequencies simultaneously. This combining approach allows the system to achieve high detection sensitivity through frequency diversity while maintaining a compact structure, as all SRRs are coupled to the same microstrip transmission line.

Inventive Principle:
Principle #5Merging (Combining)

3Measurement precision

If a reference SRR is included for calibration, then measurement accuracy is improved, but the apparatus complexity increases

Engineering Contradiction:
Improvemeasurement accuracyVSAvoidapparatus structure
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The reference SRR acts as an intermediary calibration element that mediates between the sensing SRRs and the measurement system. It provides a stable reference signal that compensates for environmental variations and system drift, improving measurement accuracy without requiring complex external calibration equipment.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The reference SRR enables self-calibration of the system by providing an internal reference signal that can be used to correct measurement errors in real-time. This self-service calibration approach improves measurement accuracy while minimizing the need for external calibration apparatus, thereby limiting the increase in overall system complexity.

Inventive Principle:
Principle #25Self-service

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables nondestructive, high-resolution detection of defects in composites and additive manufactured metals by monitoring resonant frequency shifts, providing accurate imaging and material quality assessment with improved sensitivity and penetration depth.

Implementation Method 1

Split-ring resonators (SRRs) have been used in the design of metamaterials, largely due to their frequency selective behavior. Specifically, SRRs behave as sub-wavelength resonators when excited by a time-varying magnetic field perpendicular to the plane of the SRRs.

Methodology Applied
Scientific EffectElectromagnetic resonance: Resonance

Implementation Method 2

The first sensing split-ring resonator and the second sensing split-ring resonator are configured to scan a sample... measuring a first frequency of the first sensing split-ring resonator and storing the first frequency as a first resonant frequency... in response to the subsequent first frequency shifting by a predetermined threshold from the first resonant frequency within the predetermined period, generating an alert.

Methodology Applied
Scientific EffectResonant frequency shift: Resonance

Data Source

PatentUS11137359B2Nondestructive imaging using a split-ring resonator sensing apparatus
Publication Date: 2021.10.05 BOARD OF TRUSTEES OPERATING MICHIGAN STATE UNIV
  • US11137359B2 patent drawing
  • US11137359B2 patent drawing
  • US11137359B2 patent drawing

AI summary

A defect sensing apparatus is configured to identify defects or targets in materials. A further aspect of the defect sensing apparatus includes a reference split-ring resonator coupled to the microstrip. The defect sensing apparatus includes a reference split-ring resonator located on a reference side of the microstrip and a first sensing split-ring resonator located on a sensing side of the microstrip.