Split Test Circuit Layout for Low-Standby Power Semiconductors

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Solution Overview

Problem

Conventional semiconductor devices with built-in self-diagnosis functions suffer from high static power consumption in standby mode due to the implementation of test circuits in always-on regions, leading to unnecessary energy waste.

Innovation Solution

The semiconductor device is configured with test circuits split into two regions: a first region that remains powered on in all modes and a second region that powers off in standby mode, with specific test circuits in each region to reduce unnecessary power consumption.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If test circuits are implemented in always-on regions to enable self-diagnosis function, then reliability is improved, but static power consumption increases

Engineering Contradiction:

Improveself-diagnosis functionVSAvoidstatic power consumption

Core Design Contradiction:

ReliabilityVSUse of energy by stationary object

Solution Approach 1:

The semiconductor device is divided into two distinct regions: an always-on region that remains powered during standby mode and a power-off region that is powered down during standby mode. Test circuits are strategically placed in both regions, with first test circuits in the always-on region and second test circuits in the power-off region, enabling self-diagnosis functionality while minimizing static power consumption by keeping only essential test circuits active during standby.

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

Different regions of the semiconductor device are assigned different power states and test circuit configurations based on their specific functional requirements. The always-on region contains critical test circuits that must remain active, while the power-off region contains non-critical test circuits that can be powered down, creating local quality variations in power consumption and test coverage across the device.

Inventive Principle:

Principle #3Local quality

2Use of energy by stationary object

If test circuits are placed in power-off region, then static power consumption is reduced, but diagnosis coverage during standby mode is limited

Engineering Contradiction:

Improvestatic power consumptionVSAvoiddiagnosis coverage

Core Design Contradiction:

Use of energy by stationary objectVSReliability

Solution Approach 1:

The test circuit functionality is segmented into two separate sets: first test circuits located in the always-on region and second test circuits located in the power-off region. This segmentation allows the device to maintain comprehensive self-diagnosis capability by having different test circuits available in different power states, ensuring that diagnosis coverage is not limited even when portions of the device are powered down.

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

The first test circuits in the always-on region are prepared in advance to provide immediate self-diagnosis functionality during standby mode, while the second test circuits in the power-off region are ready to be activated when needed. This preliminary arrangement ensures that diagnosis coverage is maintained without requiring continuous power to all test circuits.

Inventive Principle:

Principle #10Preliminary action

Data Source

PatentUS12591008B2Semiconductor device, vehicle-mounted appliance, and consumer appliance

Publication Date: 2026.03.31 ROHM CO LTD

AI summary

For example, a semiconductor device includes a first region configured to be always kept in a power-on state regardless of whether in a first operation mode or a second operation mode, a second region configured to be in a power-on state in the first operation mode and in a power-off state in the second operation mode, a first test circuit configured to be implemented in the first region, and a second test circuit configured to be implemented in the second region.