Scanning Probe Microscopy Full Response Acquisition

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Solution Overview

Problem

Conventional atomic force microscopy and spectroscopy techniques discard valuable information by limiting data acquisition to a narrow frequency band around the excitation frequency, missing nonlinear and transient responses due to the use of lock-in amplifiers, which are unable to access frequency components outside this band.

Innovation Solution

The method involves exciting the probe or sample with a time-varying signal at a first frequency band and measuring the response signal at a broader second frequency band, allowing for full data acquisition and subsequent analysis using data acquisition systems and multivariate methods to extract statistically significant information.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a lock-in amplifier is used to isolate the probe response at a single frequency, then the signal-to-noise ratio is improved, but the frequency components outside the detection bandwidth are lost

Engineering Contradiction:
Improvesignal-to-noise ratioVSAvoidfrequency components outside detection bandwidth
Core Design Contradiction:
Measurement precisionVSLoss of information

Solution Approach 1:

The frequency spectrum is segmented into multiple bands, with each lock-in amplifier detecting a specific frequency band. Instead of using a single lock-in amplifier that detects only one frequency, the system divides the frequency range into multiple segments and uses multiple lock-in amplifiers to detect each segment simultaneously, thereby capturing the complete frequency spectrum while maintaining high signal-to-noise ratio for each band

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The detection system transitions from one-dimensional single-frequency detection to multi-dimensional frequency band detection. By adding the frequency band dimension, the system can simultaneously measure multiple frequency components, transforming the limitation of single-frequency detection into a capability for comprehensive spectral analysis

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Device complexity

If the probe response is measured only at the excitation frequency, then the measurement system remains simple, but valuable nonlinear and transient information is discarded

Engineering Contradiction:
Improvemeasurement system complexityVSAvoidnonlinear and transient response information
Core Design Contradiction:
Device complexityVSLoss of information

Solution Approach 1:

The frequency spectrum is segmented into multiple bands, with each lock-in amplifier detecting a specific frequency band. Instead of using a single lock-in amplifier that detects only one frequency, the system divides the frequency range into multiple segments and uses multiple lock-in amplifiers to detect each segment simultaneously, thereby capturing the complete frequency spectrum while maintaining high signal-to-noise ratio for each band

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The detection system transitions from one-dimensional single-frequency detection to multi-dimensional frequency band detection. By adding the frequency band dimension, the system can simultaneously measure multiple frequency components, transforming the limitation of single-frequency detection into a capability for comprehensive spectral analysis

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables the capture and analysis of the entire probe response, providing a more comprehensive understanding of the probe-sample interaction, including nonlinear and transient components, and allowing for higher resolution and detailed exploration of sample properties.

Implementation Method 1

a laser-photodetector system to track changes in the deflection of a cantilever beam

Methodology Applied
Scientific EffectPhotodetection: Photoelectric Effect

Data Source

PatentUS9612257B1Full information acquisition in scanning probe microscopy and spectroscopy
Publication Date: 2017.04.04 UT BATTELLE LLC
  • US9612257B1 patent drawing
  • US9612257B1 patent drawing
  • US9612257B1 patent drawing

AI summary

Apparatus and methods are described for scanning probe microscopy and spectroscopy based on acquisition of full probe response. The full probe response contains valuable information about the probe-sample interaction that is lost in traditional scanning probe microscopy and spectroscopy methods. The full probe response is analyzed post data acquisition using fast Fourier transform and adaptive filtering, as well as multivariate analysis. The full response data is further compressed to retain only statistically significant components before being permanently stored.