Scanning Probe Microscope Holder with Screw Fixation
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Solution Overview
Problem
Current holder systems for scanning probe microscopes, such as atomic force microscopes, face issues with sample fixation in low-pressure and high-temperature environments due to the volatilization of organic compounds in conductive aluminum tape, leading to carbon deposits and thermal drift, which require time-consuming manual cleaning and stress relief.
Innovation Solution
A holder system with a fixer mechanism that uses a screw-based attachment system, incorporating spiral, threaded, and hooked structures, to securely affix samples without adhesives, ensuring no material volatilization and balanced thermal expansion, thus preventing carbon deposits and thermal drift.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Strength
If conductive aluminum tape is used to attach the sample to the holder, then the sample can be fixed to the holder, but the organic compounds of the tape will volatilize in low-pressure environment and form carbon deposits on the test piece
Solution Approach 1:
The patent removes the adhesive tape component entirely from the fixation system. Instead of using conductive aluminum tape with organic compounds, the invention employs a mechanical fixation mechanism where the sample holder directly contacts and secures the test piece through friction and geometric constraints, eliminating the source of carbon deposits while maintaining fixation strength
Solution Approach 2:
The patent replaces the chemical bonding mechanism (adhesive tape) with a pure mechanical fixation system. The sample is secured through physical contact and friction between the holder surface and test piece, combined with geometric constraints from the holder structure, substituting chemical adhesion with mechanical retention
2Strength
If conductive aluminum tape is used to attach the sample to the holder, then the sample can be fixed to the holder, but the tape will generate stress in high-temperature environment causing the test piece to drift or vibrate
Solution Approach 1:
The patent uses a holder structure made of the same material (metal) as the test piece. This homogeneity ensures that both components expand and contract at similar rates during temperature cycling, preventing differential thermal expansion from generating stress that would cause drift or vibration, while maintaining secure fixation
3Reliability
If manual cleaning of carbon deposits is performed, then the conductivity of the test piece can be restored, but the process is time-consuming and uneconomical
Solution Approach 1:
The patent eliminates the source of carbon deposits by removing the adhesive tape from the system. Without organic compounds in the fixation mechanism, no carbon deposits form on the test piece, thereby eliminating the need for manual cleaning operations and associated time losses while maintaining electrical conductivity
4Strength
If the fixer applies stress to the sample toward the holder top surface, then the sample can be securely affixed, but the area to-be-tested must be exposed to the fixer fixing portion
Solution Approach 1:
The patent applies fixation stress only at the edges or periphery of the test piece rather than across the entire surface. The fixer contacts only the boundary regions to provide securing force, leaving the central area-to-be-tested completely exposed and accessible, thereby achieving secure fixation with minimal impact on the test area
Data Source
AI summary
A holder system for a scanning probe microscope, including a holder and a fixer. The holder includes a holder top surface, and a holder sidewall. The holder top surface is configured to hold a sample. The holder sidewall extends from the holder top surface. The fixer includes a fixer fixing portion, and a fixer connecting portion. The fixer fixing portion is configured to affix the sample to the holder top surface. The fixer connecting portion is connected to the fixer fixing portion, and is affixed to the holder sidewall. An area to-be-tested of the sample is exposed to the fixer fixing portion.