Scanning Probe Microscope Particle Analysis Validation
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Solution Overview
Problem
Scanning probe microscopes face issues in accurately calculating the number of particle images, leading to improper analysis due to incorrect calculations or abnormalities in the observation area, which can result in incorrect analysis results.
Innovation Solution
The scanning probe microscope is equipped with an observation device and an information processing device that generates observation images and calculates particle parameters such as diameter or number, allowing for predetermined processing to detect and exclude images outside a set range, preventing incorrect analysis.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the scanning probe microscope calculates the number of particle images using the image data, then the analysis can be performed, but incorrect calculations or abnormalities may occur leading to improper analysis results
Solution Approach 1:
The patent applies preliminary action by performing validation checks on observation images before they are used for particle analysis. The system calculates particle parameters (diameter, number) for each observation image, checks whether these parameters fall within predetermined ranges, and identifies inappropriate images before they can corrupt the overall analysis results. This preventive approach ensures that only valid data contributes to the final analysis.
Solution Approach 2:
The patent implements feedback by establishing a closed-loop validation system. The observation images undergo particle parameter calculation, followed by range checking that provides feedback on whether each image is appropriate for analysis. This feedback mechanism allows the system to automatically identify and flag inappropriate images, enabling corrective actions such as re-observation or exclusion from analysis, thereby improving the reliability of results.
2Productivity
If the scanning probe microscope performs analysis on all observation images, then the productivity is improved, but abnormal images may be included leading to incorrect results
Solution Approach 1:
The system performs preliminary validation of particle parameters (diameter and number) against predetermined ranges before including observation images in the final analysis. This preliminary action filters out abnormal images automatically, ensuring that only images with valid particle parameters contribute to the analysis results, thus maintaining both productivity and measurement precision.
Solution Approach 2:
The patent utilizes parameter changes by establishing predetermined range thresholds for particle parameters (diameter and number). By comparing calculated parameters against these predefined ranges, the system automatically identifies inappropriate observation images. This parameter-based filtering approach enables efficient validation without requiring manual inspection, maintaining high productivity while ensuring measurement accuracy.
3Reliability
If the scanning probe microscope sets predetermined ranges for particle parameters, then inappropriate images can be detected, but additional processing time is required
Solution Approach 1:
The patent replaces manual image validation with automated computational processing. Instead of requiring operators to manually inspect each observation image for appropriateness, the system automatically calculates particle parameters, compares them against predetermined ranges, and identifies inappropriate images. This substitution of mechanical/manual validation with automated computational methods minimizes additional processing time while maintaining high reliability.
Data Source
AI summary
A scanning probe microscope is equipped with an observation device for observing a sample containing particles and an information processing device. The information processing device generates one or more observation images based on observation data acquired by observing a sample with the observation device, calculates a particle parameter indicating a diameter of a particle image or the number of the particle images, the particle image being included in the observation image, and executes predetermined processing when an observation image including an image in which the particle parameter is outside a predefined observation range is included in one or more observation images.