SPM Stage Bottom Light Irradiation Avoids Cantilever Blockage
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Solution Overview
Problem
Scanning probe microscopy (SPM) systems face challenges in effectively irradiating light onto samples due to blockage by the cantilever, limiting the use of light-activated caged compounds and requiring complex, expensive optical systems that are not easily shareable or detachable.
Innovation Solution
A stage for SPM with optical transparency and a bottom-surface light irradiation mechanism, using LEDs with adjustable wavelengths and a battery-powered system, allowing light to be directed through an opening below the sample substrate, avoiding cantilever blockage and enabling versatile use across multiple SPM systems.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Illumination intensity
If light is irradiated onto a sample from the top in an SPM system, then the optical path can be established, but the light is blocked by the cantilever preventing effective irradiation
Solution Approach 1:
The patent inverts the conventional light irradiation direction by placing the light source below the sample substrate and irradiating light upward through the transparent substrate. This reversal of the optical path eliminates the cantilever blockage problem, as the light now travels from the opposite direction and the cantilever no longer obstructs the optical path.
Solution Approach 2:
The patent introduces a new spatial dimension for light irradiation by utilizing the bottom surface of the sample substrate as the entry point for light. This dimensional change from top-down to bottom-up irradiation allows light to reach the sample without being blocked by the cantilever, effectively adding a new optical access dimension to the SPM system.
2Adaptability or versatility
If a complex optical system is added to SPM for light irradiation, then light irradiation function is achieved, but the system becomes expensive and difficult to share or detach
Solution Approach 1:
The patent merges the light irradiation function directly into the sample substrate by making the substrate itself transparent and positioning the light source below it. This integration eliminates the need for separate, complex optical components and pathways, reducing system complexity while maintaining light irradiation capability.
Solution Approach 2:
The transparent sample substrate serves multiple functions: it acts as both the sample mounting platform and the optical window for light irradiation. This multi-functionality reduces the need for additional specialized components, making the system more versatile and easier to share across different experiments and users.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables efficient and flexible light irradiation onto samples without cantilever interference, improving the usability and cost-effectiveness of SPM systems by allowing light irradiation from the bottom surface, facilitating the activation of caged compounds and supporting various experimental wavelengths.
Implementation Method 1
a light source 13 that irradiates light, which has a wavelength set beforehand, from the bottom surface direction of the sample substrate 12 to the sample
Implementation Method 2
fixing a sample substrate 12, which mounts a sample 100 to be observed thereon and has optical transparency
Data Source
AI summary
It is an object of the invention to provide a stage for scanning probe microscopy that can be used in any kind of SPM and can effectively irradiate light to a sample and a solution near the sample without irradiated light blocked by a cantilever. The stage for scanning probe microscopy of the invention is a stage for scanning probe microscopy for fixing a sample substrate that mounts a sample to be observed thereon and has optical transparency and includes an opening that is provided below a portion where the sample substrate is fixed and that has an opening area included within the sample substrate in plan view. Light is irradiated from a bottom surface of the sample substrate onto the sample through the opening.