SPO Recovery Unit Test Method for Nonvolatile Memory Data Integrity

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Solution Overview

Problem

Existing memory devices face challenges in accurately determining the success of Sudden Power Off (SPO) recovery operations, which can lead to data inaccuracies and reliability issues due to incomplete data deletion and recovery in nonvolatile memory devices.

Innovation Solution

A test method and device that involve storing and overwriting data in multiple storage regions, simulating a power off and subsequent power resupply to assess the operational state of the SPO recovery unit by comparing data patterns before and after the recovery process, determining the unit's success based on pattern data integrity.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If the nonvolatile memory device deletes inaccurate data and recovers pre-written data during SPO recovery operation, then data accuracy is improved, but the complexity of determining whether the recovery operation is successful increases

Engineering Contradiction:

Improvedata accuracyVSAvoidcomplexity of determining recovery success

Core Design Contradiction:

ReliabilityVSDevice complexity

Solution Approach 1:

The patent applies preliminary action by pre-storing test data in specific storage regions before the SPO recovery operation. This allows the test device to later compare the recovered data with the pre-stored test data to determine whether the recovery operation was successful, thereby simplifying the determination process while maintaining data accuracy

Inventive Principle:

Principle #10Preliminary action

Solution Approach 2:

The patent uses copying by creating a copy of test data in specific storage regions that serves as a reference for verification. The test device reads and compares this copied data with the recovered data to determine recovery success, avoiding the need for complex verification mechanisms

Inventive Principle:

Principle #26Copying

2Reliability

If the memory device performs complete data deletion and recovery operations, then data accuracy is improved, but the time required for the SPO recovery operation increases

Engineering Contradiction:

Improvedata accuracyVSAvoidtime for SPO recovery operation

Core Design Contradiction:

ReliabilityVSLoss of time

Solution Approach 1:

The patent applies partial action by performing data deletion and recovery operations only on specific storage regions that contain test data or are suspected to be affected by SPO, rather than conducting complete scans of all memory regions. This reduces the time required while maintaining data accuracy for critical regions

Inventive Principle:

Principle #16Partial or excessive action

Solution Approach 2:

The patent segments the memory device into multiple storage regions, allowing the SPO recovery operation to be performed selectively on specific regions rather than the entire memory space. This segmentation enables parallel processing and reduces the overall time required for recovery operations

Inventive Principle:

Principle #1Segmentation

Data Source

PatentUS8289791B2Test method and device for memory device

Publication Date: 2012.10.16 SAMSUNG ELECTRONICS CO LTD

AI summary

Provided is a test method for a memory device including a plurality of storage regions and an SPO recovery unit. The test method stores data in the plurality of storage regions. The test method shuts off supply of power to the memory device and resupplies the power to the memory device. The test method determines an operational state of the SPO recovery unit after the resupplying step based on the stored data.