Two-Axis Spot Light Beam Product Inspection Device
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Solution Overview
Problem
Existing product inspection devices either use high-power lamps that affect organoleptic properties and require high energy, or they use lasers moving in one axis, resulting in low return signals and short analysis times, making spectrometric analysis impractical.
Innovation Solution
A device with a spot light beam that moves in two axes, using optical means with mirrors to direct the beam for localized illumination and analysis, combined with a conveyance system for moving products through a two-dimensional inspection region, allowing for controlled exposure and improved signal quality.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Illumination intensity
If high-power lamps are used to completely illuminate the product, then sufficient light for analysis is obtained, but the product is exposed to high temperature which may affect organoleptic properties and energy expenditure is high
Solution Approach 1:
The patent applies local quality by using a spot light beam that illuminates only a specific localized region of the product rather than completely illuminating the entire product. This localized illumination approach provides sufficient light intensity for spectrometric analysis while minimizing the overall temperature exposure of the product, thereby preserving organoleptic properties and reducing energy consumption.
2Device complexity
If a laser moves in one axis performing a fixed single-line scan, then the device structure is simpler, but the analysis time is very short and the amount of reflected light is very small which hinders spectrometric analysis
Solution Approach 1:
The patent transitions from one-axis laser scanning to two-axis spot light beam movement. This dimensional expansion allows the light beam to systematically scan across the entire inspection surface in both horizontal and vertical directions, significantly increasing the analysis time and the amount of reflected light collected, thereby enabling effective spectrometric analysis while maintaining reasonable device complexity.
3Area of stationary object
If the light beam sweeps the entire inspection surface at high speed, then the inspection coverage is complete, but the time of analysis is very short and the return signal is very small making spectrometric analysis impractical
Solution Approach 1:
The patent implements periodic action by moving the spot light beam in a systematic two-axis scanning pattern across the inspection surface. This methodical back-and-forth movement ensures complete coverage of the inspection area while allowing sufficient dwell time at each location to collect adequate reflected light signals, thereby maintaining both comprehensive inspection coverage and high measurement precision for spectrometric analysis.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables faster and more effective product inspection with higher quality return signals for spectrometric analysis, reducing energy consumption and minimizing product exposure to high temperatures.
Implementation Method 1
a radiation source with means for emitting a spot light beam to at least partially illuminate the surface of the product
Implementation Method 2
analyzing the light reflected and/or scattered by the product
Implementation Method 3
analyzing the light reflected and/or scattered by the product
Implementation Method 4
detection means for analyzing the light scattered and/or reflected by the product
Data Source
AI summary
The invention relates to a product inspection and characterization device, including conveyance means, a two-dimensional inspection region, a radiation source generating a spot light beam for partially illuminating the surface of the product, optical means for directing the light beam provided with at least one mirror to aim the spot light beam in the inspection region, optical means for directing the reflected and/or scattered light to detection means, detection means for analyzing the light scattered and/or reflected by the product and a processing unit for characterizing the product. The radiation source emitting the light beam is therefore pointed at the product by optical means directing the light beam to the two-dimensional inspection region. Another object of the present invention relates to the method for product inspection and characterization.