SPR Fluorescence Device Angle Adjustment
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Solution Overview
Problem
Conventional surface plasmon resonance fluorescence analysis devices face variations in measurement results due to inconsistent maximization of the intensified electric field for exciting fluorescent substances, leading to inaccuracies in specimen detection.
Innovation Solution
The device adjusts the angle of incidence of the light beam relative to the metal film on the prism by measuring the intensity of plasmon scattered light, ensuring the electric field reaches its maximum intensity, thereby optimizing the fluorescence detection process.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the angle of incidence is not accurately adjusted, then the measurement process is simple, but the measurement precision deteriorates due to variations in electric field intensity
Solution Approach 1:
The device performs preliminary adjustment of the light source angle by measuring plasmon scattered light intensity before actual fluorescence measurement. The angle is optimized in advance to maximize electric field intensity, ensuring consistent measurement conditions without adding complexity to the core measurement process.
Solution Approach 2:
The system uses feedback control by continuously monitoring plasmon scattered light intensity and adjusting the light source angle accordingly. The angle adjustment is based on feedback from the measured scattered light signal, creating a closed-loop control system that maintains optimal measurement conditions.
2Measurement precision
If plasmon scattered light measurement is added to determine the angle, then the measurement precision improves, but the device complexity increases due to additional measurement steps
Solution Approach 1:
The light source and light receiving unit serve multiple functions: they generate and detect both plasmon scattered light for angle determination and fluorescence for specimen measurement. This multi-functionality allows the same hardware components to perform different measurement tasks without increasing device complexity.
Solution Approach 2:
The system uses its own light source and detection system to automatically determine the optimal angle through plasmon scattered light measurement. The device self-adjusts its measurement parameters without requiring external calibration equipment or additional measurement systems.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach allows for accurate determination of the angle of incidence for maximum electric field intensity, enhancing the sensitivity and accuracy of specimen detection while minimizing variations in measurement results.
Implementation Method 1
by generating surface plasmon resonance in a metal film deposited on a prism, an electric field (intensified electric field) that is intensified is formed in the vicinity of the surface of the metal film
Implementation Method 2
the light beam α that has entered the prism 114 is totally reflected from the back side of the metal film 112 (side of the prism 114) at the surface 112a of the metal film 112
Implementation Method 3
detects light (fluorescence) based on an intensified electric field in the vicinity of the metal film 112
Data Source
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AI summary
The present invention: directs a light beam (a) onto a prism (21) having a metal thin film (25) formed on a specific surface (23), changing the angle of incidence (?) relative to the metal thin film (25) in a state of full reflection; measures light emitted on the surface (25a)-side of the metal thin film (25) as a result of the reflection of the light beam (a) by the metal thin film (25); determines the angle of incidence (? 5) at which to direct the light beam (a) onto the metal thin film (25) on the basis of the measured variation in light intensity; adjusts the direction in which said light beam is directed so that the light beam (a) is directed onto the metal thin film (25) at the determined angle of incidence (? 5); and measures fluorescent light emitted at the surface (25a)-side of the metal thin film (25) while the light beam (a) is being directed in the adjusted direction.