Spurious Frequency Measurement System Using Scanning Segmentation

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Solution Overview

Problem

Current measurement systems for electromagnetic radiation, such as those described in US20010052779A1, lack the capability to accurately account for spurious frequencies, resulting in reduced accuracy and efficiency in wireless communication applications.

Innovation Solution

A measurement system and method that includes a device under test, an antenna, and measurement equipment configured to scan for and perform detailed measurements of spurious frequencies, with options for using a turntable and adjustable antenna positions to enhance accuracy and efficiency, and comparing frequencies to predefined standards like CISPR 22 or EN 55022.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional electromagnetic radiation measuring apparatus is used, then the measurement process is simple, but the measurement accuracy is limited due to inability to account for spurious frequencies

Engineering Contradiction:
Improvemeasurement accuracyVSAvoidmeasurement system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The measurement process is divided into multiple stages: initial scanning phase to identify spurious frequencies, followed by detailed measurement phase at each identified frequency. This segmentation allows the system to achieve high measurement accuracy by focusing resources on specific frequencies of interest rather than attempting uniform measurement across all frequencies.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system performs preliminary scanning to detect spurious frequencies before conducting detailed measurements. This preliminary action identifies which frequencies require detailed analysis, allowing the measurement system to prepare and focus on specific frequencies in advance, thereby improving overall measurement accuracy.

Inventive Principle:
Principle #10Preliminary action

2Measurement precision

If detailed measurement is performed at all frequencies, then measurement accuracy would be high, but measurement time increases significantly

Engineering Contradiction:
Improvemeasurement accuracyVSAvoidmeasurement time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The system performs detailed measurements only at spurious frequencies that are identified during the scanning phase, rather than conducting exhaustive measurements at all possible frequencies. This partial action approach focuses measurement resources on the critical frequencies that actually affect performance, achieving high accuracy without unnecessary time consumption.

Inventive Principle:
Principle #16Partial or excessive action

Solution Approach 2:

The system extracts and isolates spurious frequencies from the overall frequency spectrum through preliminary scanning. By separating these problematic frequencies from the rest of the spectrum, the system can then apply detailed measurement only where needed, significantly reducing total measurement time while maintaining accuracy.

Inventive Principle:
Principle #2Taking out (Extraction)

3Productivity

If spurious frequencies are not accounted for in measurement, then the measurement process is faster, but the efficiency of verifying correct functioning is reduced

Engineering Contradiction:
Improvemeasurement efficiencyVSAvoidverification accuracy
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The measurement system incorporates feedback mechanisms where preliminary scanning results inform subsequent detailed measurement decisions. The system uses the identified spurious frequencies as feedback to guide where detailed measurements should be performed, ensuring that verification efforts are directed at the frequencies most critical to correct functioning, thereby improving both efficiency and reliability.

Inventive Principle:
Principle #23Feedback

Data Source

PatentUS10560203B2Measurement system and method for spurious frequency determination
Publication Date: 2020.02.11 ROHDE & SCHWARZ GMBH & CO KG
  • US10560203B2 patent drawing
  • US10560203B2 patent drawing
  • US10560203B2 patent drawing

AI summary

A measurement system is provided. The measurement system includes a device under test (DUT), an antenna, and a measuring device connected to the antenna. The measuring device is configured to scan for spurious emissions of the DUT for at least one frequency. The measuring device is further configured to determine at least one spurious frequency. The measuring device is further configured to perform a measurement at each of the at least one spurious frequency.