SRAM Bit Cell Interconnect Layout for Backside Power Routing

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Solution Overview

Problem

Existing semiconductor devices and fabrication methods face challenges in efficiently scaling down while maintaining complexity and functionality, particularly in the formation of semiconductor integrated circuits (ICs) due to the increased complexity of processing and manufacturing.

Innovation Solution

The implementation of a SRAM bit cell design with a back side power rail and specific interconnect layouts, including front and back side interconnect structures, which allows for efficient routing of conductors and power rails, enhancing the integration of GAA transistors in SRAM bit cells.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If geometry size is decreased to increase functional density, then production efficiency and cost are improved, but processing and manufacturing complexity increases

Engineering Contradiction:
Improveproduction efficiencyVSAvoidprocessing complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The patent introduces a back-side interconnect structure that routes power rails and ground lines through the substrate back surface, adding a third dimension to the interconnect architecture. This separates front-side signal routing from back-side power distribution, reducing congestion and simplifying manufacturing processes while enabling continued scaling of device geometry

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Quantity of substance

If functional density is increased by scaling down, then more devices fit per chip area, but the complexity of fabrication processes increases

Engineering Contradiction:
Improvenumber of devices per chip areaVSAvoidfabrication ease
Core Design Contradiction:
Quantity of substanceVSEase of manufacture

Solution Approach 1:

The interconnect structure is segmented into front-side components (word lines, bit lines, select lines) and back-side components (power rails, ground lines). This segmentation allows independent optimization and fabrication of each interconnect layer, simplifying the overall manufacturing process while supporting high device density through efficient space utilization

Inventive Principle:
Principle #1Segmentation

3Productivity

If interconnect routing is optimized for high density, then more transistors can be integrated, but manufacturing complexity increases

Engineering Contradiction:
Improveintegration efficiencyVSAvoidinterconnect structure complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

By utilizing the substrate back surface for power and ground routing, the patent adds a dimensional layer to the interconnect architecture. This separates power distribution from signal routing, reducing interconnect complexity on the front side while maintaining high transistor integration density through efficient three-dimensional space utilization

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Data Source

PatentUS12424274B2Memory device and manufacturing thereof
Publication Date: 2025.09.23 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US12424274B2 patent drawing
  • US12424274B2 patent drawing
  • US12424274B2 patent drawing

AI summary

Embodiments of the present disclosure relate to a memory bit cell including two doped regions and four gate structures. Bit line, bit line bar, and word line of the bit cell are formed on a front side of the bit cell and power rails are formed on a back side of the bit cell. In some embodiments, each bit cell includes two word lines.