SRAM Memory Array Section Analysis for PUF Inter-Hamming Verification
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing physically unclonable functions (PUFs) based on SRAM memory arrays face challenges in ensuring uniqueness and unclonability due to variations in power-up states, which affect their reliability and security as unique identifiers in integrated circuits.
Innovation Solution
An inter-hamming distance analyzer is used to measure and verify the inter-hamming distances between different sections of a memory array under varying operating conditions, ensuring that the PUFs have unique responses by determining maximum and minimum inter-hamming distances, thereby confirming their uniqueness and unclonability.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If PUFs are built using SRAM memory arrays based on power-up states, then unique identification is achieved, but reliability and security are compromised due to variations in power-up states
Solution Approach 1:
The memory array is divided into multiple sections, and inter-hamming distances are measured between different sections rather than treating the entire array as a single unit. This segmentation allows for more granular analysis of PUF responses and enables verification of uniqueness without requiring complete re-measurement of the entire array.
Solution Approach 2:
The system performs preliminary measurement of inter-hamming distances during manufacturing or initialization, stores these measurements, and uses them for later verification. This preliminary action ensures that reliability requirements are met before the PUF is deployed, avoiding the need for complex real-time verification during operation.
2Measurement precision
If inter-hamming distances are measured between all sections of the memory array, then uniqueness verification is improved, but measurement time and computational resources increase
Solution Approach 1:
Instead of measuring inter-hamming distances between all possible pairs of sections, the system measures distances between a selected subset of sections. This partial action provides sufficient verification of uniqueness while significantly reducing measurement time and computational resources compared to exhaustive measurement of all section pairs.
Solution Approach 2:
The system pre-identifies which section pairs need to be measured based on design requirements and stores the expected inter-hamming distance values. During verification, only these predetermined measurements are performed, eliminating the need for time-consuming exhaustive measurements while maintaining verification accuracy.
Data Source
AI summary
A memory device is provided. The memory device includes a memory array including a plurality of sections, and an inter-hamming difference analyzer. Each section includes a plurality of bits, and the numbers of the bits of the plurality of sections are the same. The inter-hamming difference analyzer is configured to obtain contents of the plurality of sections operating in different operating conditions, to obtain a plurality of inter-hamming differences of the contents, and to provide a maximum inter-hamming difference and a minimum inter-hamming difference among the inter-hamming differences of the plurality of sections. The inter-hamming difference represents the number of unlike bits between the content of one section corresponding to a first operating condition and the content of another section corresponding to a second operating condition that is different from the first operating condition.