SSD Adapter Box Positioning for High-Throughput Testing

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Solution Overview

Problem

Existing SSD testing technologies face inefficiencies due to long waiting times, low utilization rates, and low compatibility, requiring manual plugging and unplugging that can cause wear on SSDs and test ports, and lack compatibility for different interfaces.

Innovation Solution

A test device with an adapter box and positioning system that allows simultaneous plugging and unplugging of multiple SSDs, using a locking assembly and fool-proof structure to ensure stable connections and reduce wear, while supporting various SSD specifications.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If manual plugging and unplugging of SSDs is performed, then testing can be conducted, but waiting time increases and utilization rate decreases

Engineering Contradiction:
Improvetesting efficiencyVSAvoidwaiting time
Core Design Contradiction:
ProductivityVSLoss of time

Solution Approach 1:

The test device is divided into multiple test ports (first test port, second test port, etc.) that can independently test different SSDs simultaneously. The adapter box is segmented to hold multiple SSDs in different slots, allowing parallel loading and testing operations without sequential waiting.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Multiple SSDs are combined into a single adapter box that can be loaded and unloaded as one unit. The adapter box integrates multiple mounting slots and connection interfaces, enabling simultaneous connection of multiple SSDs to multiple test ports, thereby reducing the frequency of plugging/unplugging operations.

Inventive Principle:
Principle #5Merging (Combining)

2Productivity

If manual plugging and unplugging operations are performed repeatedly, then testing can be completed, but wear on SSDs and test ports increases

Engineering Contradiction:
Improvetesting throughputVSAvoidwear on SSDs and test ports
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

Multiple SSDs are pre-loaded into the adapter box before testing begins. The adapter box is prepared in advance with all SSDs positioned in their respective slots, so that when testing starts, all SSDs can be connected to test ports simultaneously without repeated plugging/unplugging operations during the testing process.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The adapter box serves as an intermediary device between the SSDs and the test ports. It provides a stable connection interface that remains attached to the test device, while SSDs are mounted on the adapter box. This intermediary structure eliminates the need for direct repeated plugging/unplugging of SSDs into test ports, reducing mechanical wear on both the SSD connectors and test port interfaces.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Reliability

If testing device is designed for specific interface type, then connection stability is improved, but compatibility with different interfaces decreases

Engineering Contradiction:
Improveconnection stabilityVSAvoidinterface compatibility
Core Design Contradiction:
ReliabilityVSAdaptability or versatility

Solution Approach 1:

The adapter box is designed with universal adaptability to support multiple interface types including M.2, U.2, and other SSD interfaces. Different test adapter plates can be installed in the adapter box according to the required interface type, allowing the same base structure to accommodate various SSD form factors and connection protocols without compromising connection stability.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The test device allows dynamic configuration by enabling the installation of different test adapter plates within the adapter box based on the specific testing requirements. The system can adapt its interface type dynamically by swapping adapter plates rather than being fixed to a single interface type, maintaining connection stability through proper mechanical and electrical interfaces for each specific type.

Inventive Principle:
Principle #15Dynamics

4Productivity

If multiple SSDs are tested simultaneously, then productivity increases, but device complexity increases

Engineering Contradiction:
Improvetesting throughputVSAvoidstructure complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The adapter box contains multiple mounting slots nested within a single structure, with each slot capable of holding an SSD. The test adapter plates are nested within the adapter box, and the entire adapter box is inserted into the test device. This nested structure allows multiple SSDs to be tested simultaneously while maintaining a compact and organized form factor that does not excessively increase overall device complexity.

Inventive Principle:
Principle #7Nested doll (Nesting)

Data Source

PatentUS12518849B2Test device, test method, and test machine
Publication Date: 2026.01.06 YANGTZE MEMORY TECH CO LTD
  • US12518849B2 patent drawing
  • US12518849B2 patent drawing
  • US12518849B2 patent drawing

AI summary

A test device includes a test plate and an adapter box. The rest plate includes a test port, and a first positioning portion disposed on the test plate. The adapter box includes a box body configured to detachably mount Solid State Drives to be tested, and a second positioning portion disposed on the box body and configured to cooperate with the first positioning portion to cause the Solid State Drives to be tested to form a communication connection with the test port.