SSD Thermal Throttling via Dynamic Temperature Control

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Solution Overview

Problem

Thermal throttling limits the performance of nonvolatile memory devices in data storage devices, particularly with the introduction of faster interfaces like PCIe Gen4, as devices are prone to reaching throttling temperature quickly due to power dissipation, restricting high-performance workloads.

Innovation Solution

A controller in the data storage device dynamically adjusts the operational temperature of nonvolatile memory devices by tracking temperature exposure and using a weighted counter algorithm to permit higher temperatures for limited durations, thereby extending the device's performance capability while maintaining reliability.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a fixed temperature threshold of 90 degrees Celsius is used for thermal throttling, then device reliability is maintained, but device performance is limited during high-performance workloads

Engineering Contradiction:
Improvedevice reliabilityVSAvoiddevice performance
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent applies dynamics by transitioning from a fixed temperature threshold to a dynamic threshold system. The controller continuously monitors temperature and adjusts the throttling threshold in real-time based on current thermal conditions, allowing the system to adapt between conservative (90°C) and aggressive (higher) thresholds depending on thermal headroom, thus resolving the contradiction between reliability and performance

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent changes the parameter of temperature threshold from a static value (90°C) to a variable parameter that can be adjusted based on thermal conditions. By modifying this critical parameter dynamically, the system can allow higher temperatures during brief high-performance periods while maintaining reliability during sustained operations

Inventive Principle:
Principle #35Parameter changes

2Reliability

If thermal throttling is applied conservatively at 90 degrees Celsius, then long-term reliability is ensured, but maximum capability and performance bursts are limited

Engineering Contradiction:
Improvelong-term reliabilityVSAvoidmaximum capability
Core Design Contradiction:
ReliabilityVSPower

Solution Approach 1:

The patent applies partial action by allowing temporary excessive temperature exposure above the conservative 90°C threshold for limited durations. The controller permits brief periods of higher temperature during performance bursts, then requires cooling periods, thus achieving partial relaxation of the thermal constraint to enable maximum capability when needed while preserving long-term reliability

Inventive Principle:
Principle #16Partial or excessive action

3Productivity

If the device operates at higher temperatures for extended periods, then performance is improved, but retention is compromised

Engineering Contradiction:
ImproveperformanceVSAvoidretention
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The patent implements periodic action through alternating cycles of high-performance operation (at higher temperatures) and cooling periods (at lower temperatures). The controller enforces a pattern where performance bursts are followed by mandatory cooling intervals, ensuring that cumulative thermal exposure remains within retention-safe limits while achieving high performance during active periods

Inventive Principle:
Principle #19Periodic action

Data Source

PatentUS11334251B2SSD operation in a nonoptimal memory environment
Publication Date: 2022.05.17 SANDISK TECHNOLOGIES LLC
  • US11334251B2 patent drawing
  • US11334251B2 patent drawing
  • US11334251B2 patent drawing

AI summary

The present disclosure generally relates to thermal throttling a nonvolatile memory device in a data storage device. Nonvolatile memory devices can sustain higher temperatures for a limited duration of time as part of the lifecycle/operation of the device. By allowing for a small margin of time at a higher temperature of operation, the maximum capability of the data storage device is increased. In so doing, the data storage device reliability can be maintained while increasing the device performance.