SSD Error Correction for Extreme Temperature Data Retention
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Data stored in memory devices, particularly at elevated temperatures or for extended periods without power, is prone to errors due to increased risk of data corruption, which can lead to loss of useful data.
Innovation Solution
Implementing two levels of parity protection, where a second level of error correction code with higher error correction capability is used for specific data portions identified as susceptible to errors, either based on predicted temperature exposure or extended storage times, providing enhanced error correctability.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If traditional error correction codes are used, then data storage is feasible, but data reliability deteriorates under elevated temperatures or extended storage periods
Solution Approach 1:
The patent divides data into different categories (frequently accessed vs. infrequently accessed data) and applies different error correction strategies to each segment. Critical data portions receive enhanced error correction codes while less critical data uses standard ECC, resolving the contradiction by providing targeted protection where needed most.
Solution Approach 2:
The patent performs preliminary classification of data before storage, identifying which data portions require enhanced protection based on access patterns and criticality. This advance preparation allows the system to apply appropriate error correction levels proactively, preventing data corruption before it occurs during storage.
2Reliability
If enhanced error correction is applied to all data, then data reliability improves, but storage capacity and write efficiency deteriorate
Solution Approach 1:
The patent applies different quality levels of error correction to different portions of data based on their specific needs. Frequently accessed or critical data receives stronger error correction while other data uses standard protection, optimizing the balance between reliability and write efficiency by avoiding unnecessary overhead on all data.
Solution Approach 2:
The patent dynamically adjusts error correction parameters based on data characteristics and storage conditions. By changing the error correction strength parameter selectively for different data portions rather than applying a fixed high level to all data, the system maintains reliability where needed while preserving write efficiency overall.
3Reliability
If more error correction bits are added, then error correction capability improves, but storage density and space utilization deteriorate
Solution Approach 1:
The patent segments data into different priority levels and applies enhanced error correction only to critical segments. This selective approach ensures that additional error correction bits are allocated only where necessary to protect important data, rather than wasting storage density on protecting all data uniformly.
Solution Approach 2:
The patent applies excessive error correction (stronger ECC) only partially to the most critical data portions that require maximum protection. For less critical data, standard error correction suffices, thereby achieving the necessary error correction capability for important data without the excessive overhead of applying strong ECC universally.
Data Source
AI summary
Systems, methods, and apparatus related to memory devices such as solid state drives. In one approach, data is received from a host system (e.g., data to be written to an SSD). The received data is encoded using a first error correction code to generate first parity data. A temperature at which memory cells of a storage device (e.g., the SSD) will store the received data is determined. In response to determining the temperature, a first portion of the received data is identified (e.g., data in memory storage that is error-prone at a predicted higher temperature that has been determined based on output from an artificial neural network using sensor(s) input). The identified first portion is encoded using a second error correction code to generate second parity data. The second error correction code has a higher error correction capability than the first error correction code. The encoded first portion, the first parity data, and the second parity data are stored in the memory cells of the storage device.