SSD Failure Prediction Using Ensemble Learning and Online Adaptation

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Solution Overview

Problem

Current methods for predicting SSD failures based on SMART data are limited by unbalanced training samples and model aging, leading to low accuracy in failure prediction.

Innovation Solution

A failure prediction method that uses a plurality of base classification models trained with historical SMART data and online data, employing majority class under-sampling ensemble learning to address the imbalance and update models dynamically, improving prediction performance.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If traditional failure prediction methods using SMART data are employed, then the prediction process can be implemented, but the accuracy of failure prediction is low due to unbalanced training samples and model aging

Engineering Contradiction:
Improvefailure prediction accuracyVSAvoidprediction model reliability
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The patent implements dynamic model updating through online learning, where the prediction model is continuously updated with new data streams. The system transitions from static offline training to dynamic online adaptation, allowing the model to evolve with changing data distributions and prevent aging effects.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent applies majority class under-sampling to modify the training data parameters by reducing the representation of healthy data points. This parameter change in data distribution balances the class imbalance between healthy and erroneous SMART data, enabling more accurate failure prediction.

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If offline training with historical data is used, then initial model performance can be achieved, but model aging occurs and prediction accuracy degrades over time

Engineering Contradiction:
Improveinitial prediction accuracyVSAvoidmodel validity period
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent ensures continuous model improvement by implementing uninterrupted online learning updates. The system continuously ingests new SMART data streams and updates the prediction model in real-time, maintaining continuous useful action rather than periodic batch updates, thus preventing model aging and extending validity period.

Inventive Principle:
Principle #20Continuity of useful action

Solution Approach 2:

The patent incorporates feedback mechanisms where prediction results and new SMART data are fed back into the model for continuous refinement. The system uses feedback from actual device performance and failure patterns to adjust model parameters and maintain high prediction accuracy over extended periods.

Inventive Principle:
Principle #23Feedback

Data Source

PatentUS11994934B2Failure prediction method and device for a storage device
Publication Date: 2024.05.28 SAMSUNG ELECTRONICS CO LTD
  • US11994934B2 patent drawing
  • US11994934B2 patent drawing
  • US11994934B2 patent drawing

AI summary

A failure prediction method and device for a storage device are provided. The method comprises: inputting SMART data of the storage device obtained in real time into each of a plurality of base classification models to obtain a classification result for the SMART data of the storage device obtained in real time that is output by the each classification model, wherein the each base classification model is obtained by training using historical SMART data of a plurality of storage devices and/or SMART data of the plurality of storage devices obtained online; determining whether the SMART data of the storage device obtained in real time is healthy data or erroneous data, based on classification results of the plurality of base classification models; predicting whether the storage device will fail, based on a number of SMART data that is determined as healthy data and a number of SMART data that is determined as erroneous data among SMART data of the storage device obtained within a predetermined time window.