SSD Failure Prediction Using Short- and Long-Term Attribute Windows

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Solution Overview

Problem

Existing failure prediction methods for SSDs in data centers lack accuracy in predicting impending failures due to reliance on short-term SMART data, failing to account for long-term trends and variations, leading to suboptimal prediction and potential data loss.

Innovation Solution

A failure prediction method using a trained machine-learning model that combines short-term and long-term attribute information, including SMART data, RAM-related information, and performance statistics, utilizing a multi-channel input structure with modules like Random Forest and LSTM to predict failure types and remaining lifetimes.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If short-term SMART data is used for failure prediction, then the prediction method is simple and fast, but the prediction accuracy is insufficient for impending failures

Engineering Contradiction:
Improveprediction speedVSAvoidfailure prediction accuracy
Core Design Contradiction:
ProductivityVSMeasurement precision

Solution Approach 1:

The patent segments the attribute information into two distinct time windows: a first time window for capturing long-term trends and distribution characteristics, and a second time window for capturing short-term operational states. This segmentation allows the system to process different temporal scales separately, maintaining computational efficiency while improving prediction accuracy by combining both perspectives.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent adds a temporal dimension to the failure prediction by incorporating historical attribute information across different time windows. Instead of relying solely on current or recent data points, the system analyzes trends and distributions over extended periods, effectively moving from a single-time-point analysis to a multi-temporal analysis that captures both short-term anomalies and long-term degradation patterns.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Measurement precision

If long-term attribute information is incorporated into failure prediction, then the prediction accuracy improves, but the data processing complexity increases

Engineering Contradiction:
Improvefailure prediction accuracyVSAvoiddata processing complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent extracts only the essential characteristics from the long-term attribute information—specifically the distribution characteristics and trend characteristics—rather than processing all raw data points. This extraction approach reduces the volume of data that needs to be processed while retaining the critical information needed for accurate failure prediction, thereby managing complexity effectively.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent performs preliminary processing of the attribute information by pre-calculating distribution characteristics and trend characteristics within the first time window before the actual failure prediction occurs. This preliminary action prepares the data in advance, organizing it into meaningful patterns that can be quickly referenced during prediction, thus reducing the computational burden at the time of prediction.

Inventive Principle:
Principle #10Preliminary action

3Reliability

If multiple attributes and time windows are analyzed, then the failure prediction comprehensiveness improves, but the computational resources required increase

Engineering Contradiction:
Improveprediction comprehensivenessVSAvoidcomputational resource consumption
Core Design Contradiction:
ReliabilityVSUse of energy by moving object

Solution Approach 1:

The patent applies partial action by focusing on specific critical attributes and their characteristics rather than processing all possible attributes in full detail. By identifying and analyzing only the most relevant distribution and trend characteristics within defined time windows, the system achieves comprehensive failure prediction coverage while avoiding the excessive computational resources that would be required to process every attribute exhaustively.

Inventive Principle:
Principle #16Partial or excessive action

Data Source

PatentUS12541411B2Failure prediction apparatus and method for storage devices
Publication Date: 2026.02.03 SAMSUNG ELECTRONICS CO LTD
  • US12541411B2 patent drawing
  • US12541411B2 patent drawing
  • US12541411B2 patent drawing

AI summary

A failure prediction apparatus and method for storage devices are provided, the method including: obtaining attribute information of a plurality of attributes for a plurality of storage devices during operation of a storage apparatus; obtaining global attribute information for each of the plurality of storage devices based on the attribute information of the plurality of attributes obtained within a first time window before the current time; and predicting failures for the plurality of storage devices using a trained machine-learning model based on attribute information of the plurality of attributes of each of the plurality of storage devices obtained within a second time window before the current time and the global attribute information of each of the plurality of storage devices.