Removable Test Terminals for SSD In-Situ Testing
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Solid State Devices (SSDs) are prone to electrostatic discharge (ESD) due to higher memory densities, which can be exacerbated by their lack of moving parts, and existing testing methods often require disassembly, making them inconvenient for in-situ testing.
Innovation Solution
The implementation of removable test terminals and auxiliary boards with replicated interfaces allows for in-situ testing of SSD components without disassembly, using connectors like pogo pins or via holes to connect with semiconductor package testers, facilitating efficient testing and subsequent removal of the auxiliary boards from the final product.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If removable test terminals and auxiliary boards are added to enable in-situ testing, then testing convenience and reliability are improved, but device complexity increases
Solution Approach 1:
The testing system is segmented into separate components: the auxiliary board with test terminals is distinct from the main SSD board. This allows the testing function to be added without permanently complicating the SSD structure, as the auxiliary board can be removed after testing.
Solution Approach 2:
The auxiliary board acts as an intermediary between the semiconductor package tester and the SSD components. It provides test terminals that connect to the SSD's memory interface, enabling testing without direct disassembly of the SSD itself, thus improving ease of operation while maintaining SSD integrity.
2Difficulty of detecting and measuring
If auxiliary boards with test terminals are used for in-situ testing, then component testing capability is improved, but manufacturing steps increase
Solution Approach 1:
The auxiliary board is prepared in advance with the appropriate test terminals and interface replication before the actual testing begins. This preliminary preparation enables complex testing capabilities to be achieved through a standardized, repeatable process that can be efficiently integrated into manufacturing.
Solution Approach 2:
The auxiliary board replicates the memory interface of the SSD using identical or compatible signal pins. This copying of the interface allows the tester to communicate with the SSD components as if they were directly accessible, enabling sophisticated testing without requiring physical disassembly or complex manufacturing modifications.
3Ease of operation
If test terminals are permanently integrated into the SSD, then testing accessibility is improved, but ESD risk and product reliability deteriorate
Solution Approach 1:
The testing configuration is made dynamic rather than static. The auxiliary board with test terminals is temporarily attached during testing and then removed, transforming the testing accessibility from a permanent feature to a temporary one. This dynamic approach allows easy testing access during the testing phase while eliminating the ESD risk associated with permanent test terminals in the final product.
Solution Approach 2:
The test terminals are extracted from the final SSD product. By using a removable auxiliary board that can be taken out after testing, the patent eliminates the ESD vulnerability that would result from permanently integrated test terminals, while still providing testing accessibility during the manufacturing process.
Data Source
AI summary
Example embodiments of the inventive concept are directed to solid state device products, intermediate solid state devices, and methods of manufacturing and testing the same, with removable test terminals, which may permit in situ testing of one or more components of the solid state device products.