SSD Self-Evaluation via Simulated Access Commands
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Solution Overview
Problem
Current evaluation techniques for semiconductor storage devices, such as SSDs, are costly and require significant configuration space due to their complex interfaces, making it difficult to assess the long-term reliability of these devices during manufacturing.
Innovation Solution
An evaluation method and system that includes a semiconductor storage device with a nonvolatile memory, a control program, and a test program, which generates simulated access commands to evaluate the reliability of the nonvolatile memory by executing a test program within the device, eliminating the need for external control boards and reducing configuration complexity.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If external control boards are used to evaluate SSD reliability, then evaluation accuracy is improved, but device complexity and manufacturing cost increase
Solution Approach 1:
The SSD performs self-evaluation by executing a test program stored in its nonvolatile memory. The control unit generates simulated access commands and controls access to the nonvolatile memory autonomously, eliminating the need for external control boards and host devices. This self-service approach maintains evaluation accuracy while significantly reducing system complexity.
Solution Approach 2:
The test program creates simulated access commands that replicate actual host device commands. These simulated commands are executed within the SSD itself, copying the evaluation function from the external host device into the SSD's internal control unit, thereby eliminating external evaluation equipment.
2Reliability
If external control boards are used for evaluation, then evaluation capability is improved, but manufacturing cost increases
Solution Approach 1:
The SSD uses its own control unit and nonvolatile memory to execute evaluation tests. The test program is stored in the nonvolatile memory and executed by the control unit, eliminating the need for expensive external control boards and host devices. This self-contained approach significantly reduces manufacturing costs while maintaining evaluation capability.
Solution Approach 2:
Instead of requiring external evaluation hardware, the SSD copies the evaluation functionality into its own control unit through the test program. This internalization of the evaluation function eliminates the need for costly external equipment and simplifies the manufacturing process.
3Reliability
If external host devices are used for evaluation, then evaluation accuracy is improved, but configuration space requirement increases
Solution Approach 1:
The SSD performs all evaluation operations internally using its own control unit and nonvolatile memory. The simulated access commands are generated and executed within the SSD's internal architecture, eliminating the need for external host devices and significantly reducing the configuration space required for evaluation.
Solution Approach 2:
The evaluation function is copied from the external host device into the SSD's internal control unit. The test program generates simulated commands that replicate host device operations, allowing the SSD to evaluate itself without requiring external configuration space.
Data Source
AI summary
An evaluation method is proposed to evaluate reliability of a nonvolatile memory in a semiconductor storage device with respect to data writing and data reading. While power is being supplied to the semiconductor storage device, a test program and the control program are written in a storage unit of the semiconductor storage device. The test program being written to control execution of an evaluation test performed for evaluating the reliability of the nonvolatile memory and generate a simulated access command identical to an access command input externally for accessing the nonvolatile memory. Access to the nonvolatile memory is controlled according to the test program and control program in the storage unit.