SSD Separate Test Voltage Terminals Reduce Testing Time
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Solid state drive (SSD) systems face challenges in reducing test times due to limitations in supplying operational and test voltages, leading to inefficiencies in reading and writing multiple memory blocks, which can result in current drops and increased testing times.
Innovation Solution
The SSD system employs separate connection terminals for operational and test voltages, with the test voltage being larger and not passing through a voltage regulator, allowing for simultaneous reading and writing of multiple memory blocks without current drops, and includes an auxiliary memory for storing test firmware to reduce testing stress.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Loss of time
If operational and test voltages are supplied through the same connection terminals and voltage regulator, then device complexity is reduced, but test time increases and current drops occur during multi-block testing
Solution Approach 1:
The connection terminals are segmented into two distinct sets: first connection terminals for supplying operational voltages and second connection terminals for supplying test voltages. This segmentation allows independent optimization of test operations without being constrained by operational voltage supply paths, thereby reducing test time and preventing current drops during multi-block testing.
Solution Approach 2:
The test voltage supply path is extracted from the operational voltage supply path. The test voltages are supplied directly through second connection terminals without passing through the voltage regulator used for operational voltages. This extraction eliminates the bottleneck caused by the voltage regulator during testing, enabling faster test operations.
2Reliability
If test firmware is stored in the same semiconductor memory as operational data, then device complexity is reduced, but testing stress increases and reliability decreases
Solution Approach 1:
The semiconductor memory is segmented into two functional areas: one for storing operational data and another for storing test firmware. This segmentation allows test operations to be performed independently without interfering with operational data, reducing testing stress on the memory system and improving reliability.
Solution Approach 2:
The test firmware storage function is extracted from the operational data storage function. By dedicating specific memory blocks for test firmware, the system eliminates the conflict between test operations and operational data integrity, allowing comprehensive testing without compromising reliability.
Data Source
AI summary
According to example embodiments, a solid state drive system includes at least one semiconductor memory, a control circuit including first connection terminals, and second connection terminals. The first connection terminals may be configured to supply one or more operational voltages to the at least one semiconductor memory. The second connection terminals may be configured to supply one or more test voltages to the at least one semiconductor memory.