Stack Semiconductor Package Filler Stress Relief
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Solution Overview
Problem
Stack type semiconductor packages face issues with warping, twisting, or distortion during processing due to mechanical and thermal stress, which compromises the reliability of inter-package connectors and overall package stability.
Innovation Solution
A stack type semiconductor package design that includes a lower and upper package substrate with inter-package connectors, where a filler material, such as an epoxy resin or polymer-based material, is used to fill the gap between the substrates, surrounding the connectors to alleviate stress and enhance reliability.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Volume of moving object
If stack type semiconductor packages are used to improve integration degree and miniaturization, then the degree of integration increases and device size decreases, but the packages warp, twist, or distort during subsequent processing
Solution Approach 1:
A filler material is introduced as an intermediary substance between the lower and upper package substrates. This filler surrounds the inter-package connector and fills the gap between substrates, acting as a mediator that prevents warping and twisting while maintaining the compact stack structure. The filler material provides mechanical support and stress distribution without compromising the miniaturized form factor.
Solution Approach 2:
The patent employs composite material construction by combining different materials with complementary properties: the package substrates, semiconductor chips, inter-package connectors, and filler materials form a multi-material composite structure. This composite approach allows optimization of each component for its specific function while achieving overall structural stability in the miniaturized package.
2Reliability
If inter-package connectors are used to connect upper and lower packages, then electrical connection is achieved, but the connectors are susceptible to shock and thermal cycle stress causing cracked solder joints
Solution Approach 1:
The filler material is positioned beforehand to surround the inter-package connector, creating a protective cushion against upcoming shock and thermal cycle stresses. This prior cushioning prevents direct transmission of mechanical shocks and thermal expansion/contraction forces to the solder joints, preventing cracked solder joints before they can occur.
Solution Approach 2:
The filler acts as an intermediary protective layer between the external environment (shock, thermal cycles) and the inter-package connector. It absorbs and distributes harmful stresses, preventing them from reaching the vulnerable solder joints while maintaining electrical connectivity.
3Adaptability or versatility
If the upper package substrate is larger than the lower package substrate, then stacking is enabled, but stress is concentrated on the inter-package connector
Solution Approach 1:
The filler material serves as a stress-distributing intermediary between the upper and lower package substrates. It fills the gap created by the size difference and surrounds the inter-package connector, distributing the stress over a larger area and preventing concentration on the connector itself.
Solution Approach 2:
The patent changes the physical parameters of the interface between substrates by introducing filler material with different mechanical properties. This alters the stress distribution characteristics, transforming the stress concentration problem into a distributed stress state that the connector can withstand.
Data Source
AI summary
A stack type semiconductor package includes a lower semiconductor package including a lower package substrate and at least one lower semiconductor chip disposed on the lower package substrate; an upper semiconductor package including an upper package substrate larger than the lower package substrate and at least one upper semiconductor chip disposed on the upper package substrate; an inter-package connector connecting an upper surface of the lower package substrate to a lower surface of the upper package substrate; and a filler filling in between the lower package substrate and the upper package substrate while substantially surrounding the inter-package connector.


