3D Stacked Capacitor Structure for High-Density Memory

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Solution Overview

Problem

Two-dimensional memory devices face limitations in performance and manufacturing cost due to interference between memory cells and the need for expensive equipment for fine patterning, while three-dimensional devices require increased capacitance for improved performance and efficiency.

Innovation Solution

A semiconductor device with alternately stacked capacitor electrode layers and dielectric layers, along with conductive pillars and insulation layers, is designed to enhance capacitance and reduce manufacturing costs by integrating capacitors within the same process steps as memory cells, allowing for high-capacity storage within a small area.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If the line width of circuits is narrowed for high integration in two-dimensional memory devices, then the data storage capacity per area is improved, but interference between memory cells increases causing performance degradation

Engineering Contradiction:
Improvedata storage capacity per areaVSAvoidperformance
Core Design Contradiction:
Quantity of substanceVSReliability

Solution Approach 1:

The patent transitions from a two-dimensional planar structure to a three-dimensional vertical structure by stacking capacitor electrode layers and dielectric layers alternately in the vertical direction. This dimensional change allows memory cells to be stacked vertically, increasing storage capacity without narrowing line widths, thereby avoiding interference issues while maintaining performance.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Quantity of substance

If the line width of circuits is narrowed for high integration, then data storage capacity per area is improved, but manufacturing cost increases due to expensive equipment requirements

Engineering Contradiction:
Improvedata storage capacity per areaVSAvoidmanufacturing cost
Core Design Contradiction:
Quantity of substanceVSEase of manufacture

Solution Approach 1:

By adopting a three-dimensional stacked structure with alternating capacitor electrode layers and dielectric layers, the patent achieves high integration without requiring fine line width patterning equipment. The vertical stacking approach uses standard fabrication processes, avoiding the need for expensive advanced lithography tools while still increasing storage capacity per area.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Reliability

If the capacitance of capacitors is increased for three-dimensional memory device operation, then performance is improved, but device complexity increases

Engineering Contradiction:
ImproveperformanceVSAvoiddevice complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent divides the capacitor structure into multiple discrete layers - alternating capacitor first electrode layers, capacitor second electrode layers, and dielectric layers - stacked vertically. Each layer serves a specific function, and the segmented modular structure allows for systematic fabrication and assembly, managing complexity through standardization of repeating units.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent increases capacitance by extending the capacitor structure into the vertical dimension with multiple stacked layers, rather than increasing the area of single-layer capacitors. This vertical expansion provides additional capacitance while using the same planar footprint, and the repetitive layered structure allows for systematic manufacturing processes.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Data Source

PatentUS20230268379A1Semiconductor device including capacitors and manufacturing method thereof
Publication Date: 2023.08.24 SK HYNIX INC
  • US20230268379A1 patent drawing
  • US20230268379A1 patent drawing
  • US20230268379A1 patent drawing

AI summary

A semiconductor device includes a stack including a plurality of electrode layers which include a plurality of capacitor first electrode layers and a plurality of capacitor second electrode layers alternately stacked on a substrate and a plurality of dielectric layers which are disposed alternately with the plurality of electrode layers; a first conductive pillar passing through the stack and coupled to the plurality of capacitor first electrode layers; a second conductive pillar passing through the stack and coupled to the plurality of capacitor second electrode layers; and a plurality of insulation layer patterns insulating the first conductive pillar and the plurality of capacitor second electrode layers from each other and insulating the second conductive pillar and the plurality of capacitor first electrode layers from each other.