Stacked Semiconductor Chip Layout for Wafer Waste Reduction

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Solution Overview

Problem

In semiconductor devices where two wafers are bonded, size mismatches lead to unnecessary regions, resulting in inefficiencies and increased waste during the manufacturing process.

Innovation Solution

The semiconductor device design includes a configuration where the array chip has a smaller lower surface area than the circuit chip, with the barycenter positions of both surfaces offset, and utilizes a spacer to flatten the stepped area, allowing for more efficient stacking and reduced risk of chip tilt during assembly.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If two wafers are bonded with mismatched sizes, then bonding is achieved, but unnecessary regions increase causing waste and inefficiency

Engineering Contradiction:
Improvebonding processVSAvoidwafer area
Core Design Contradiction:
Ease of manufactureVSLoss of substance

Solution Approach 1:

The wafer is divided into a first wafer and a second wafer with different sizes, allowing each to be optimized independently. The smaller second wafer can be fully utilized while the larger first wafer provides sufficient bonding area without excessive waste.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent employs asymmetric wafer sizing where the first wafer has a larger area than the second wafer. This asymmetric configuration allows the smaller second wafer to be fully utilized while minimizing the unnecessary region on the larger first wafer, optimizing material usage.

Inventive Principle:
Principle #4Asymmetry

2Loss of substance

If wafer sizes are matched exactly, then waste is minimized, but flexibility in design and assembly is reduced

Engineering Contradiction:
Improvewafer areaVSAvoiddesign flexibility
Core Design Contradiction:
Loss of substanceVSAdaptability or versatility

Solution Approach 1:

The patent deliberately uses asymmetric wafer sizes with the first wafer being larger than the second wafer. This provides design flexibility in terms of chip layout, assembly options, and future modifications while still minimizing waste through optimized area utilization.

Inventive Principle:
Principle #4Asymmetry

Solution Approach 2:

The larger first wafer serves multiple functions: it provides sufficient bonding area for the smaller second wafer, allows for future expansion or modification, and enables different assembly configurations. The extra area becomes a versatile resource rather than waste.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Ease of operation

If chips are stacked with offset barycenters, then alignment flexibility is improved, but stability during assembly may be compromised

Engineering Contradiction:
Improvealignment flexibilityVSAvoidchip stacking stability
Core Design Contradiction:
Ease of operationVSStability of the object's composition

Solution Approach 1:

The patent employs asymmetric positioning where the barycenter of the second wafer is offset from the barycenter of the first wafer in the in-plane direction. This asymmetric offset provides alignment flexibility for different chip configurations while the overall structure maintains stability through careful design of the bonding interfaces.

Inventive Principle:
Principle #4Asymmetry

Data Source

PatentUS20240284684A1Semiconductor device and manufacturing method thereof
Publication Date: 2024.08.22 KIOXIA CORP
  • US20240284684A1 patent drawing
  • US20240284684A1 patent drawing
  • US20240284684A1 patent drawing

AI summary

A semiconductor device according to the present embodiment includes a first semiconductor chip and a second semiconductor chip. The first semiconductor chip has a first upper surface on which a first electrode pad is formed. The second semiconductor chip has a first lower surface on which a second electrode pad directly joined to the first electrode pad is formed and a second upper surface that is opposite the first lower surface and on which a third electrode pad is formed. The area of the first lower surface is smaller than the area of the first upper surface. The barycenter of the first lower surface and the barycenter of the first upper surface are located at different positions in the in-plane direction of the first upper surface.