Stacked Coil Pattern Layout Without Dummy Patterns

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Solution Overview

Problem

The addition of a dummy pattern to coil patterns in stacked configurations affects high-frequency characteristics due to signal reflection, and existing methods to improve process conditions during the formation of upper-layer coil patterns are inadequate.

Innovation Solution

The coil component design includes specific spacing and overlapping configurations between turns of stacked coil patterns, eliminating the need for a dummy pattern, which prevents exposure failures and maintains high-frequency characteristics.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If a dummy pattern is added to the lower-layer coil pattern to prevent process condition deterioration, then manufacturing precision is improved, but high-frequency characteristics deteriorate due to signal reflection

Engineering Contradiction:
Improveprocess condition formationVSAvoidhigh-frequency characteristics
Core Design Contradiction:
Manufacturing precisionVSReliability

Solution Approach 1:

The harmful dummy pattern is completely removed from the design. Instead of adding a dummy pattern to compensate for insulating layer unevenness, the invention extracts and eliminates the source of the problem (dummy pattern) while using a different approach (adjusted turn spacing) to achieve the same manufacturing precision goal without compromising high-frequency characteristics

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The spacing between turns is made non-uniform in specific local regions. The distance between adjacent turns is adjusted locally at certain positions to compensate for insulating layer unevenness, rather than using a global dummy pattern. This localized spacing adjustment maintains both manufacturing precision and high-frequency performance

Inventive Principle:
Principle #3Local quality

2Manufacturing precision

If the distance between adjacent turns is adjusted to compensate for insulating layer unevenness, then manufacturing precision is improved, but device complexity increases

Engineering Contradiction:
Improvepattern formation consistencyVSAvoidcoil pattern design
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The turn spacing parameter is modified in specific regions to compensate for insulating layer unevenness. By changing the distance between adjacent turns at selected positions, the invention achieves consistent pattern formation without requiring complex dummy patterns or additional structural elements, thus improving manufacturing precision while maintaining design simplicity

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS20250292937A1Coil component
Publication Date: 2025.09.18 TDK CORP
  • US20250292937A1 patent drawing
  • US20250292937A1 patent drawing
  • US20250292937A1 patent drawing

AI summary

Disclosed herein is a coil component that includes first and second coil patterns. The first coil pattern includes first and second turns adjacent to each other. The second coil pattern includes third and fourth turns adjacent to each other. The first turn includes first and second sections. The third turn includes third to fifth sections. The first and third sections overlap each other. The second and fourth sections overlap each other. The space between second section and the second turn increases as advancing in the winding direction. The space between fourth section and the fourth turn increases as advancing in the winding direction. The fifth section does not overlap the first turn. The space between the fifth section and the fourth turn decreases as advancing in the winding direction.