Stacked Die ID Assignment via TSV and Bonding Pads
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Solution Overview
Problem
In stacked microelectronics packages, existing technologies face challenges in efficiently assigning unique device IDs to each integrated circuit die and detecting the total number of dice within the stack, which is crucial for addressing and interconnecting devices effectively.
Innovation Solution
The implementation of circuitry within each die that generates a unique device ID value using through-substrate vias (TSVs) and conductive bonding pads, along with assignment and evaluation devices, allows for automatic ID assignment and detection of the total number of dice, enabling efficient addressing and interconnection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If manual device ID assignment and die counting methods are used in stacked packages, then device identification can be achieved, but the process is time-consuming and reduces productivity
Solution Approach 1:
The system performs self-identification where each die automatically generates its own device ID and the stack automatically counts its own dies through electrical connection detection, eliminating the need for manual external programming and counting processes
Solution Approach 2:
Device IDs are generated and stored in non-volatile memory before the dies are stacked, and the total die count is determined during the stacking process itself, preparing identification data in advance to avoid post-assembly programming time
2Adaptability or versatility
If unique device IDs are assigned to each die in a stack, then device addressing capability is improved, but device complexity increases
Solution Approach 1:
The device ID generation circuitry is merged with the existing non-volatile memory structure, using the same memory cells and programming mechanisms that are already present for data storage, thereby avoiding additional dedicated ID storage hardware
Solution Approach 2:
The same memory programming mechanisms and electrical connection detection circuits are used for multiple purposes: programming device IDs, storing data, and determining total die count, eliminating the need for separate dedicated circuits for each function
3Ease of manufacture
If through-substrate vias and conductive bonding pads are used for ID assignment, then manufacturing precision requirements increase
Solution Approach 1:
Conductive bonding pads serve as intermediary elements that provide robust electrical connection between dies and through-substrate vias, accommodating normal manufacturing tolerances through their larger surface area and flexible connection geometry
Solution Approach 2:
The conductive bonding pads are designed to completely cover the through-substrate vias, creating a nested structure where the via is embedded within the pad, ensuring reliable electrical connection while tolerating positional variations within manufacturing tolerances
Data Source
AI summary
Various embodiments comprise apparatuses to assign a respective one of a sequence of unique device identification (ID) values to each die in a stacked device. In an embodiment, each die may include a respective assignment device to operate on an input and generate, as an output, the respective one of the sequence of the unique device ID values. Each die may also include a respective evaluation device to detect a total number of dice in the stack. Additional apparatuses and methods are described.


