Stacked-Die PUF Entropy Source for Tamper-Resistant IC Security

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Solution Overview

Problem

Existing integrated circuits (ICs) are vulnerable to physical attacks such as laser and focused ion beam attacks, particularly in stacked-die packages where through-silicon vias expose unencrypted configuration data, necessitating improved security measures.

Innovation Solution

A physically unclonable function (PUF) entropy source is implemented using passive and active circuit elements in a stacked IC die configuration, with passive elements between active layers and metal layers, making direct observation impossible and requiring physical de-processing for access.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of operation

If through-silicon vias are used to communicate configuration data between dice in stacked-die packages, then signal transmission between dice is enabled, but security is compromised due to exposed probe points

Engineering Contradiction:
Improvesignal transmissionVSAvoidphysical attack vulnerability
Core Design Contradiction:
Ease of operationVSObject-affected harmful factors

Solution Approach 1:

The patent embeds the PUF circuitry within the stacked-die structure itself, nesting the security function inside the physical package. The passive circuit elements are embedded within the substrate of one die, while active circuit elements are placed on another die in the stack, creating a nested configuration that protects the PUF against physical attacks while maintaining functionality.

Inventive Principle:
Principle #7Nested doll (Nesting)

Solution Approach 2:

The patent transitions from a two-dimensional planar layout to a three-dimensional stacked configuration. By distributing PUF elements across multiple vertical layers (different dies in the stack), the design exploits the third dimension to separate passive and active elements, making physical probing more difficult while maintaining signal connectivity through the stack.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Object-affected harmful factors

If passive circuit elements are embedded within the substrate and active circuit elements are placed on another die, then direct observation of active elements becomes impossible, but device complexity increases

Engineering Contradiction:
Improvetamper resistanceVSAvoidstacked die configuration
Core Design Contradiction:
Object-affected harmful factorsVSDevice complexity

Solution Approach 1:

The patent combines multiple functions into the stacked-die package structure. The same package that provides mechanical support and electrical interconnection also serves as the security mechanism by physically separating and protecting the PUF elements. This merging reduces the need for additional dedicated security hardware while achieving enhanced protection.

Inventive Principle:
Principle #5Merging (Combining)

Data Source

PatentUS12564062B2Multi-die physically unclonable function entropy source
Publication Date: 2026.02.24 XILINX INC
  • US12564062B2 patent drawing
  • US12564062B2 patent drawing
  • US12564062B2 patent drawing

AI summary

Disclosed circuit arrangements include a physically unclonable function (PUF) entropy source having passive circuit elements and active circuit elements. A first die has one or more metal layers and an active layer, and the passive circuit elements are disposed in the one or more metal layers. A second die has one or more metal layers and an active layer. The active circuit elements are coupled to the passive circuit elements and are disposed in the active layer of the second die, and the first die and the second die are in a stacked structure. The stacked structure has the one or more metal layers of the first die disposed between the active layer of the first die and the active layer of the second die.