Stacked Photoelectric Sensor Protection Circuits for ESD Reliability

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Solution Overview

Problem

The operation reliability of photoelectric conversion apparatuses is compromised due to electrostatic noise and damage to internal circuits when protection circuits are placed in regions overlapping pads, leading to increased chip area and reduced electrostatic protection effectiveness.

Innovation Solution

A photoelectric conversion apparatus is designed with a laminated structure of two semiconductor substrates, where a first protection circuit is placed on one substrate and a second protection circuit is placed on the other, both connected to the pad but positioned outside the pad's region in planar view, thereby increasing the electrostatic protection area without increasing the chip area and minimizing the impact of wire bonding pressure.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Area of stationary object

If the protection circuit is arranged in the region overlapping the pad in planar view, then the area of the protection circuit is increased, but the characteristics of the protection circuit change due to pressure from wire bonding

Engineering Contradiction:
Improvearea of protection circuitVSAvoidelectrostatic resistance
Core Design Contradiction:
Area of stationary objectVSReliability

Solution Approach 1:

The patent extends the protection circuit from a single-plane (2D) layout to a multi-layer (3D) configuration by placing protection circuits on both the first semiconductor substrate and the second semiconductor substrate. This dimensional transition allows the protection circuit area to be increased without concentrating all protection elements in the pad region, thereby reducing the impact of wire bonding pressure on any single protection circuit while maintaining overall electrostatic protection capability.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The protection circuit is divided into multiple segments distributed across different substrates. Specifically, a first protection circuit is provided on the first semiconductor substrate and a second protection circuit is provided on the second semiconductor substrate. This segmentation distributes the electrostatic protection function across multiple locations, reducing the vulnerability of any single protection circuit to pressure-induced characteristic changes from wire bonding.

Inventive Principle:
Principle #1Segmentation

2Reliability

If the area of the protection circuit is increased, then the electrostatic protection capability is improved, but the chip area increases

Engineering Contradiction:
Improveelectrostatic protection capabilityVSAvoidchip area
Core Design Contradiction:
ReliabilityVSArea of stationary object

Solution Approach 1:

The patent utilizes the vertical dimension by stacking semiconductor substrates to increase the protection circuit area. By placing protection circuits on both the first and second substrates, the total protection circuit area is effectively doubled without increasing the planar chip footprint. This multi-layer approach allows enhanced electrostatic protection capability while maintaining a compact chip area.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Power

If the gate oxide film is made thinner, then the voltage at which dielectric breakdown occurs is reduced, but the susceptibility to electrostatic discharge increases

Engineering Contradiction:
Improveoperating voltageVSAvoidsusceptibility to electrostatic discharge
Core Design Contradiction:
PowerVSObject-affected harmful factors

Solution Approach 1:

The patent implements protection circuits that act as preventive measures against electrostatic discharge before it can reach and damage the thin gate oxide films. These protection circuits are positioned to intercept and dissipate electrostatic charges that might otherwise cause dielectric breakdown, providing a cushioning effect that protects the low-voltage circuitry from high-voltage electrostatic events.

Inventive Principle:
Principle #11Beforehand cushioning (Prior cushioning)

Data Source

PatentUS12176340B2Photoelectric conversion apparatus having semiconductor substrates and protection circuits
Publication Date: 2024.12.24 CANON KK
  • US12176340B2 patent drawing
  • US12176340B2 patent drawing
  • US12176340B2 patent drawing

AI summary

A photoelectric conversion apparatus includes a pad, a first protection circuit provided on a first semiconductor substrate, and a second protection circuit provided on a second semiconductor substrate. The first semiconductor substrate, which includes a plurality of photoelectric conversion units each receiving incident light and generating signal charge, and the second semiconductor substrate, which includes at least one signal processing circuit that processes an input signal based on the generated signal charge, are laminated. The pad receives a power supply voltage as input from an outside of the photoelectric conversion apparatus. At least one of the first protection circuit or the second protection circuit is provided on an outside of a region in which the pad is provided, in planar view. At least one of the first protection circuit or the second protection circuit is connected to the pad.