Stacked IC Voltage Select Output Unit for Short Circuit Prevention
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Solution Overview
Problem
Conventional methods for monitoring internal voltages in integrated circuits with multiple stacked semiconductor devices face inefficiencies due to short circuits and the need for external select code input, especially when testing multiple devices, as default voltages are shared and may differ, leading to prolonged testing times.
Innovation Solution
An integrated circuit design with a voltage select output unit and stack operation control unit that selectively outputs internal voltages to a shared pad, using a stack signal to control the output of default voltages and allow for efficient testing without short circuits, by generating select signals based on the stack signal and select code variations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If default voltages are outputted to preset pads of multiple stacked semiconductor devices, then forcing tests can be implemented easily and quickly, but short circuits occur among the stacked devices
Solution Approach 1:
The patent implements dynamic control of voltage output by introducing a stack signal that changes the operational state of the voltage select output unit based on stacking configuration. When stacked, the system dynamically switches to a state where only non-default voltages are outputted, preventing short circuits while maintaining testing capability. This dynamic adaptation resolves the contradiction between quick default voltage testing and short circuit prevention.
Solution Approach 2:
The patent changes the voltage output parameter based on the stacking condition. By using the stack signal to control whether default or non-default voltages are outputted, the system adapts its voltage parameters to the physical configuration. This parameter change ensures that when devices are stacked, the voltage output is modified to prevent short circuits, thus resolving the contradiction between testing efficiency and safety.
2Measurement precision
If external select codes are input to control voltage selection in stacked devices, then voltage monitoring can be performed, but testing time is prolonged
Solution Approach 1:
The patent implements self-service by automatically generating select signals within the semiconductor device based on the stack signal and select code, eliminating the need for external control. The voltage select output unit autonomously determines which voltage to output based on internal logic that considers the stacking configuration. This self-service mechanism maintains precise voltage monitoring capability while significantly reducing testing time by removing external control overhead.
Solution Approach 2:
The patent performs preliminary action by pre-configuring the voltage selection logic within the device structure. The stack operation control unit is designed to automatically interpret the select code and generate appropriate select signals based on the stacking state, so that when testing begins, the correct voltage is already selected and ready for immediate monitoring. This preliminary configuration eliminates the time-consuming external control process while maintaining measurement precision.
3Productivity
If multiple semiconductor devices are stacked in a single package, then integration density is improved, but default voltages from different devices may differ causing short circuits
Solution Approach 1:
The patent applies segmentation by dividing the voltage output control into device-specific segments. Each semiconductor device in the stack has its own stack operation control unit that independently processes the select code and generates select signals based on its own stacking status. This segmentation ensures that each device's voltage output is individually controlled and adapted to the stacking configuration, preventing short circuits caused by voltage mismatches while maintaining high integration density.
Solution Approach 2:
The patent implements local quality by making each semiconductor device's voltage output characteristics specific to its local stacking context. The stack signal and select code interpretation are performed locally within each device, allowing each device to adapt its voltage output to its specific position and configuration in the stack. This local adaptation ensures voltage compatibility among stacked devices with different characteristics while preserving integration density benefits.
Data Source
AI summary
An integrated circuit includes a plurality of semiconductor devices. Each of the semiconductor devices includes an internal voltage generation unit configured to generate a plurality of internal voltages, a voltage select output unit configured to output a default voltage of a plurality of internal voltages to a preset pad in response to an initial value of a select code, and selectively output the other voltages of the plurality of internal voltages to the pad in response to variations of the select code, and a stack operation control unit configured to control the voltage select output unit to output the default voltage to the pad in response to a stack signal and a predetermined value of the select code, instead of the initial value of the select code, and whether or not to activate the stack signal is determined according to whether or not the plurality of semiconductor devices are stacked.