Stacked Image Sensor Logic Pixel Substrate Segmentation

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Solution Overview

Problem

Current image sensor manufacturing processes are complex and not highly integrated, limiting the efficiency and integration density of image sensors.

Innovation Solution

The design includes a lower substrate with logic circuits and an upper substrate with pixels, where all upper transistors are of the same conductivity type, and an interconnection layer connects the two substrates, simplifying the manufacturing process and enhancing integration density by sharing transistors and reducing crosstalk between pixels.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If different conductivity type transistors are used in the upper substrate to achieve versatile logic functions, then the functional versatility is improved, but the manufacturing process complexity increases

Engineering Contradiction:
Improvefunctional versatilityVSAvoidmanufacturing process complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The image sensor is divided into two separate substrates: the upper substrate contains only pixels with transistors of the same conductivity type, while the lower substrate contains logic circuits with transistors of different conductivity types. This segmentation allows each substrate to be optimized independently, simplifying the manufacturing process while maintaining functional versatility through the interconnection layer.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent transitions from a single-substrate architecture to a stacked multi-substrate architecture. By moving logic circuits to the lower substrate and keeping only pixel transistors in the upper substrate, the solution adds a vertical dimension to the device structure, enabling process simplification without sacrificing functionality.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Reliability

If more transistors are integrated in the upper substrate to reduce crosstalk, then the signal isolation is improved, but the manufacturing complexity increases

Engineering Contradiction:
Improvesignal isolationVSAvoidmanufacturing complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent segments the transistor functions between two substrates: pixel transistors remain in the upper substrate while logic circuit transistors are moved to the lower substrate. This segmentation reduces the number of transistors in the upper substrate, simplifying manufacturing while maintaining signal isolation through the physical separation and interconnection layer design.

Inventive Principle:
Principle #1Segmentation

3Quantity of substance

If a stacked structure is used to increase integration density, then the integration density is improved, but the manufacturing process complexity increases

Engineering Contradiction:
Improveintegration densityVSAvoidmanufacturing process complexity
Core Design Contradiction:
Quantity of substanceVSDevice complexity

Solution Approach 1:

The patent merges the pixel substrate and logic circuit substrate into a single stacked structure connected by an interconnection layer. This combining achieves high integration density by utilizing three-dimensional space while managing manufacturing complexity through process segmentation and standardized interconnection interfaces.

Inventive Principle:
Principle #5Merging (Combining)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration simplifies the manufacturing process and improves integration density by allowing all upper transistors to be of the same conductivity type, enhancing photoelectric efficiency and reducing crosstalk, leading to more efficient image sensing.

Implementation Method 1

a photoelectric conversion region configured to change light energy into electric signals

Methodology Applied
Scientific EffectPhotoelectric effect: Photoelectric Effect

Data Source

PatentUS10424611B2Image sensor including first and second overlapping device isolation patterns
Publication Date: 2019.09.24 SAMSUNG ELECTRONICS CO LTD
  • US10424611B2 patent drawing
  • US10424611B2 patent drawing
  • US10424611B2 patent drawing

AI summary

An image sensor includes a lower substrate including logic circuits and an upper substrate including pixels. Transistors provided on the upper substrate have the same conductivity type. Each of the transistors includes source/drain regions provided in the upper substrate, an upper gate electrode provided on the upper substrate, and a silicon oxide layer disposed between the upper substrate and the upper gate electrode. The silicon oxide layer is in physical contact with the upper substrate and the upper gate electrode.