Stacked Logic and Passive Layout With Backside Power Contacts
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
The semiconductor industry faces challenges in integrating passive devices with active devices on the same chip, particularly at smaller nodes like 7-nm and beyond, where increased device density and complex power distribution networks are required.
Innovation Solution
A semiconductor structure is developed with an active device region and a passive device region separated by a single diffusion break. The passive device region includes a first passive device with vertically connected diffusion regions, connected to a backside power distribution network and a BEOL structure through direct backside contacts and middle-of-line contacts, respectively.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If passive devices are integrated with active devices on the same semiconductor chip, then device functionality is enhanced, but process complexity increases
Solution Approach 1:
The patent combines passive devices (diodes, capacitors) and active devices (FETs) into a single integrated semiconductor structure using unified fabrication processes. The passive devices are formed within the same process flow as the active devices, merging previously separate manufacturing sequences into one cohesive process that reduces overall complexity while enhancing device functionality.
Solution Approach 2:
The patent employs universal fabrication processes that can manufacture both passive and active devices using the same equipment and process steps. The diffusion, oxidation, and deposition processes serve multiple functions by creating different device types simultaneously, allowing a single process module to produce multi-functional semiconductor structures.
2Productivity
If FETs are scaled to smaller nodes to increase device density, then real estate usage is improved, but manufacturing precision requirements increase
Solution Approach 1:
The patent transitions from planar device layouts to three-dimensional stacked architectures, where multiple FETs are vertically stacked above each other. This dimensional change allows significant increase in device density without proportionally increasing manufacturing precision requirements, as the vertical stacking can be achieved through self-aligned processes that leverage existing lithographic capabilities.
Solution Approach 2:
The patent segments the semiconductor structure into multiple discrete stacked FETs, each with its own gate, source, and drain regions. This segmentation allows independent optimization and control of each transistor while maintaining compact overall footprint, enabling high device density through modular vertical integration rather than requiring monolithic high-precision structures.
3Area of stationary object
If backside power distribution network is introduced to improve power distribution, then real estate usage is improved, but device complexity increases
Solution Approach 1:
The patent inverts the conventional power distribution architecture by moving the power distribution network from the frontside to the backside of the semiconductor substrate. This inversion allows the active device region to be fully utilized for logic functions while the backside handles power delivery, effectively doubling the usable real estate without significantly increasing overall device complexity.
Data Source
AI summary
Embodiments of present invention provide a semiconductor structure. The structure includes an active device region and a passive device region, the active device region and the passive device region being separated by a single diffusion break, where the passive device region includes a first passive device. The first passive device includes a first diffusion region and a second diffusion region, the first and the second diffusion region being vertically connected by a lightly doped region, where the first diffusion region is connected to a backside power distribution network through a first direct backside contact (BSCA) and the second diffusion region is connected to a back-end-of-line (BEOL) structure through a first middle-of-line contact. A method of forming the same is also provided.


