Stacked Memory and Cache Circuit Layout for High-I/O Integration

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Solution Overview

Problem

The semiconductor industry faces challenges in manufacturing processing units and memory circuits with different electrical characteristics on the same die, as it is not economically feasible, and existing packaging technologies like 2.5D and 3D IC packaging struggle to accommodate varying I/O terminals effectively.

Innovation Solution

The implementation of a memory circuit configuration that includes a primary memory circuit and a cache memory circuit, each with distinct memory cells types, coupled via separate controller circuits, allowing for efficient data access and management through a hybrid 2.5D/3D IC packaging approach, enabling faster read/write operations and configurable access channels.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If processing unit and memory circuit are manufactured on the same die using the same manufacturing process, then device complexity is reduced, but manufacturing precision and electrical characteristics cannot be optimized for each component type

Engineering Contradiction:
Improveintegration structureVSAvoidelectrical characteristics
Core Design Contradiction:
Device complexityVSManufacturing precision

Solution Approach 1:

The system is divided into separate processing unit die and memory circuit die, each optimized for their specific functions and manufactured using appropriate processes, then integrated through 2.5D/3D packaging with interposers and through-silicon vias

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent transitions from traditional 2D planar integration to 2.5D and 3D vertical integration, stacking memory dies over processing dies and using interposers to enable high-density I/O connections without increasing footprint area

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Ease of manufacture

If conventional 2D IC packaging is used, then manufacturing is simpler, but I/O terminal capacity is limited

Engineering Contradiction:
Improvepackaging processVSAvoidI/O terminals
Core Design Contradiction:
Ease of manufactureVSQuantity of substance

Solution Approach 1:

The patent employs 2.5D IC packaging where multiple memory dies are arranged in a grid pattern on an interposer substrate, and 3D IC packaging where memory dies are stacked vertically over processing dies, dramatically increasing I/O terminal capacity while maintaining compact form factor

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

Interposer substrates with through-silicon vias and redistribution layers serve as intermediary components, enabling high-density interconnections between processing units and memory circuits while providing mechanical support and signal routing

Inventive Principle:
Principle #24Intermediary (Mediator)

3Quantity of substance

If 2.5D IC packaging is used to increase I/O terminals, then connectivity capacity improves, but manufacturing complexity increases

Engineering Contradiction:
ImproveI/O terminalsVSAvoidpackaging structure
Core Design Contradiction:
Quantity of substanceVSDevice complexity

Solution Approach 1:

The interposer substrate performs multiple functions simultaneously: mechanical support for stacked dies, electrical interconnection through through-silicon vias, signal redistribution through copper traces, and thermal management, thereby managing complexity through functional integration

Inventive Principle:
Principle #6Universality (Multi-functionality)

4Reliability

If separate dies are used for processing and memory units, then electrical characteristics are optimized, but integration density decreases

Engineering Contradiction:
Improveelectrical characteristicsVSAvoidintegration density
Core Design Contradiction:
ReliabilityVSArea of moving object

Solution Approach 1:

The patent utilizes vertical stacking in 3D IC packaging to place memory dies directly over processing dies, utilizing the third dimension (height) to achieve high integration density while maintaining separate optimization of electrical characteristics for each component type

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Data Source

PatentUS12093176B2Memory circuit and cache circuit configuration
Publication Date: 2024.09.17 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US12093176B2 patent drawing
  • US12093176B2 patent drawing
  • US12093176B2 patent drawing

AI summary

A memory system includes multiple groups of primary memory cells residing in a first die or a stack of first dies, multiple groups of cache memory cells residing in a second die, an interposer, and control circuits residing in a third die. Each group of the cache memory cells is associated with a corresponding group of the primary memory cells. The first die or the stack of first dies is coupled to a top surface of the second die through a first group of bumps. A bottom surface of the second die is coupled to a top surface of the interposer through a second group of bumps. The control circuits are associated with the primary memory cells and the cache memory cells. The third die is positioned aside the second die and coupled to the top surface of the interposer through a third group of pumps.