3D Stacked Semiconductor Memory With Through-Via Capacitor Layout

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Existing semiconductor devices face challenges in increasing data storage capacity and integration efficiency.

Innovation Solution

A semiconductor device is designed with a stacked structure comprising multiple semiconductor structures and a passive element structure, including a conductive layer and through-vias, to enhance integration and data storage capacity.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If memory cells are arranged two-dimensionally, then the device structure is simple, but the data storage capacity is limited

Engineering Contradiction:
Improvedata storage capacityVSAvoiddevice structure
Core Design Contradiction:
Quantity of substanceVSDevice complexity

Solution Approach 1:

The patent transitions from two-dimensional memory cell arrangement to three-dimensional stacked structure by adding vertical layers (first semiconductor structure, second semiconductor structure, third semiconductor structure stacked in Z-direction), thereby increasing data storage capacity without proportionally increasing planar area

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Productivity

If multiple semiconductor structures are stacked, then the integration is improved, but the manufacturing complexity increases

Engineering Contradiction:
Improveintegration efficiencyVSAvoidstacked structure
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The device is divided into separate semiconductor structures (first, second, third) that can be manufactured and processed independently before being stacked together, allowing modular manufacturing that improves integration while managing complexity through standardized interfaces

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Multiple semiconductor structures are nested vertically in a stacked configuration where each structure contains circuit elements and interconnection lines that are integrated with adjacent structures through bonding interfaces, achieving high integration density

Inventive Principle:
Principle #7Nested doll (Nesting)

3Area of stationary object

If passive elements are placed on the lower surface of substrates, then the area for circuit elements is expanded, but the connection complexity increases

Engineering Contradiction:
Improvearea for circuit elementsVSAvoidconnection structure
Core Design Contradiction:
Area of stationary objectVSDevice complexity

Solution Approach 1:

Through-vias act as intermediary connection structures that penetrate through the substrate to electrically connect passive elements on the lower surface with circuit elements on upper layers, managing connection complexity through standardized via structures

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

Passive elements are positioned on the lower surface of substrates (utilizing the Z-dimension) rather than competing for planar space with circuit elements, effectively expanding the available area for circuit elements while maintaining electrical connectivity through vertical via structures

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Data Source

PatentUS20250324618A1Semiconductor devices and data storage systems including the same
Publication Date: 2025.10.16 SAMSUNG ELECTRONICS CO LTD
  • US20250324618A1 patent drawing
  • US20250324618A1 patent drawing
  • US20250324618A1 patent drawing

AI summary

A semiconductor device may include: a first semiconductor structure including a first substrate, first circuit elements on the first substrate, first circuit interconnection lines on the first circuit elements, and a first peripheral region insulating layer; a second semiconductor structure including a first region of a second substrate on the first semiconductor structure, second circuit elements on the first region of the second substrate, and second circuit interconnection lines on the second circuit elements; a capacitor structure including a first capacitor electrode spaced apart from the first circuit interconnection lines on a lower surface of the second substrate, a second region of the second substrate facing the first capacitor electrode, and a first through-via extending in the second substrate and electrically connected to the first capacitor electrode; and a third semiconductor structure including a third substrate on the second semiconductor structure, and memory cells on the third substrate.