Stacked Semiconductor Package Encapsulation for Interlayer Adhesion

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Solution Overview

Problem

The reliability of stacked semiconductor chips in semiconductor packages is a challenge due to the limitations of existing packaging technologies, which struggle to ensure effective electrical connection, mechanical protection, and thermal dissipation while maintaining a compact and lightweight design.

Innovation Solution

A semiconductor package design that incorporates through silicon vias (TSVs), conductive pads, conductive bumps, an interlayer adhesive layer, and an encapsulant to enhance the electrical and mechanical connection between stacked semiconductor chips, with the encapsulant extending into interlayer spaces to improve adhesion and reliability.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Volume of moving object

If semiconductor chips are stacked to reduce size and increase capacity, then the compactness and capacity are improved, but the reliability of electrical connection between chips deteriorates

Engineering Contradiction:
Improvepackage sizeVSAvoidelectrical connection reliability
Core Design Contradiction:
Volume of moving objectVSReliability

Solution Approach 1:

The patent introduces an interlayer adhesive layer as an intermediary substance between stacked semiconductor chips. This adhesive layer fills the interlayer space and provides mechanical support and electrical connection stability, resolving the reliability issue that arises from compact stacking without excessive spacing.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent employs a composite structure combining multiple materials: conductive bumps for electrical connection, interlayer adhesive layer for mechanical bonding, and encapsulant for protection. This composite approach ensures both compact stacking and reliable electrical connections by leveraging the complementary properties of different materials.

Inventive Principle:
Principle #40Composite materials

2Volume of moving object

If interlayer space is reduced to improve compactness, then the volume is reduced, but the adhesion between chips deteriorates

Engineering Contradiction:
Improveinterlayer space volumeVSAvoidadhesion strength
Core Design Contradiction:
Volume of moving objectVSStrength

Solution Approach 1:

The patent changes the physical and chemical parameters of the interlayer adhesive layer, including its viscosity, curing temperature, and composition ratios. By optimizing these parameters, the adhesive maintains strong bonding strength even in reduced interlayer spaces, resolving the contradiction between compactness and adhesion.

Inventive Principle:
Principle #35Parameter changes

3Strength

If encapsulant is extended into interlayer space to improve adhesion, then the adhesion strength is improved, but the manufacturing complexity increases

Engineering Contradiction:
Improveadhesion strengthVSAvoidmanufacturing process complexity
Core Design Contradiction:
StrengthVSDevice complexity

Solution Approach 1:

The patent merges the encapsulant formation process with the interlayer adhesive application process. The encapsulant is formed to extend into the interlayer space during the same packaging step, eliminating the need for separate processes and reducing manufacturing complexity while maintaining enhanced adhesion.

Inventive Principle:
Principle #5Merging (Combining)

Data Source

PatentUS20240006382A1Semiconductor package
Publication Date: 2024.01.04 SAMSUNG ELECTRONICS CO LTD
  • US20240006382A1 patent drawing
  • US20240006382A1 patent drawing
  • US20240006382A1 patent drawing

AI summary

The reliability of stacked semiconductor packages may be improved via a semiconductor package including a first semiconductor chip including through silicon vias (TSVs) with respective upper conductive pads electrically connected to the TSVs, a second semiconductor chip on the first semiconductor chip with lower conductive pads on a lower surface of the second semiconductor chip, conductive bumps between the upper conductive pads and the lower conductive pads, and an interlayer adhesive layer between the first semiconductor chip and the second semiconductor chip. An interlayer space is between the first semiconductor chip and the second semiconductor chip and overlaps the first semiconductor chip and the second semiconductor chip in a vertical direction. The encapsulant extends into the interlayer space.